2009 IEEE International Workshop on Memory Technology, Design, and Testing
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On Distinguishing Process Corners for Yield Enhancement in Memory Compiler Generated SRAM

2009 IEEE International Workshop on Memory Technology, Design, and Testing ◽

10.1109/mtdt.2009.23 ◽

2009 ◽

Author(s):

Chia-Chi Hsiao ◽

Hung-Ming Chen

Keyword(s):

Yield Enhancement

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2009 IEEE International Workshop on Memory Technology, Design, and Testing ◽

10.1109/mtdt.2009.4 ◽

2009 ◽

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Rapid and Accurate Timing Modeling for SRAM Compiler

2009 IEEE International Workshop on Memory Technology, Design, and Testing ◽

10.1109/mtdt.2009.26 ◽

2009 ◽

Cited By ~ 3

Author(s):

Yen-Yu Chen ◽

Shi-Yu Huang ◽

Yi-Chung Chang

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A Wide-VDD Embedded SRAM for Dynamic Voltage Asynchronous Systems

2009 IEEE International Workshop on Memory Technology, Design, and Testing ◽

10.1109/mtdt.2009.14 ◽

2009 ◽

Author(s):

Shu-Meng Yang ◽

Meng-Fan Chang ◽

Kung-Ting Chen ◽

Wen-Chin Wu ◽

Yuan-Hua Chu ◽

...

Keyword(s):

Asynchronous Systems ◽

Dynamic Voltage ◽

Embedded Sram

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Invited Talk 3

2009 IEEE International Workshop on Memory Technology, Design, and Testing ◽

10.1109/mtdt.2009.29 ◽

2009 ◽

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Program Committee

2009 IEEE International Workshop on Memory Technology, Design, and Testing ◽

10.1109/mtdt.2009.7 ◽

2009 ◽

Keyword(s):

Program Committee

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High-k Hf-Based Nanocrystal Memory Capacitors with IrOx Metal Gate for NAND Application

2009 IEEE International Workshop on Memory Technology, Design, and Testing ◽

10.1109/mtdt.2009.15 ◽

2009 ◽

Author(s):

W. Banerjee ◽

S. Maikap

Keyword(s):

Metal Gate ◽

High K ◽

Nanocrystal Memory

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Invited Talk 2

2009 IEEE International Workshop on Memory Technology, Design, and Testing ◽

10.1109/mtdt.2009.28 ◽

2009 ◽

Author(s):

S. Natarajan

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Organizing Committee

2009 IEEE International Workshop on Memory Technology, Design, and Testing ◽

10.1109/mtdt.2009.6 ◽

2009 ◽

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Title Page iii

2009 IEEE International Workshop on Memory Technology, Design, and Testing ◽

10.1109/mtdt.2009.2 ◽

2009 ◽

Keyword(s):

Title Page

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2009 IEEE International Workshop on Memory Technology, Design, and Testing
Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

On Distinguishing Process Corners for Yield Enhancement in Memory Compiler Generated SRAM

Table of Contents

Rapid and Accurate Timing Modeling for SRAM Compiler

A Wide-VDD Embedded SRAM for Dynamic Voltage Asynchronous Systems

Invited Talk 3

Program Committee

High-k Hf-Based Nanocrystal Memory Capacitors with IrOx Metal Gate for NAND Application

Invited Talk 2

Organizing Committee

Title Page iii

Export Citation Format

2009 IEEE International Workshop on Memory Technology, Design, and TestingLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

On Distinguishing Process Corners for Yield Enhancement in Memory Compiler Generated SRAM

Table of Contents

Rapid and Accurate Timing Modeling for SRAM Compiler

A Wide-VDD Embedded SRAM for Dynamic Voltage Asynchronous Systems

Invited Talk 3

Program Committee

High-k Hf-Based Nanocrystal Memory Capacitors with IrOx Metal Gate for NAND Application

Invited Talk 2

Organizing Committee

Title Page iii

2009 IEEE International Workshop on Memory Technology, Design, and Testing
Latest Publications