Proceedings of the Fifth Asian Test Symposium (ATS'96)
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Yield improvement by test error cancellation

2002 ◽  
Author(s):  
Mill-Jer Wang ◽  
Yen-Shung Chang ◽  
J.E. Chen ◽  
Yung-Yuan Chen ◽  
Shaw-Cherng Shyu
Keyword(s):  
Yield Improvement ◽  
Test Error ◽  
Error Cancellation

scholarly journals A test methodology for interconnect structures of LUT-based FPGAs

2002 ◽  
Author(s):  
H. Michinishi ◽  
T. Yokohira ◽  
T. Okamoto ◽  
T. Inoue ◽  
H. Fujiwara
Keyword(s):  
Test Methodology

Thermal monitoring of safety-critical integrated systems

2002 ◽  
Author(s):  
V. Szekely ◽  
M. Rencz ◽  
J.M. Karam ◽  
M. Lubaszewski ◽  
B. Courtois
Keyword(s):  
Integrated Systems ◽  
Thermal Monitoring ◽  
Safety Critical
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