Advances in X-Ray Analysis
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TOTAL DOCUMENTS

69

(FIVE YEARS 0)

H-INDEX

5

(FIVE YEARS 0)

Published By Springer US

9781461290759, 9781461319351

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

X-Ray Microanalysis for Alloy Design

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-1935-1_9 ◽

1987 ◽

pp. 67-75 ◽

Cited By ~ 2

Author(s):

Katsumi Ohno ◽

Michio Yamazaki

Keyword(s):

Alloy Design ◽

X Ray

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High Resolution Digital X-Ray Rocking Curve Topography

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-1935-1_63 ◽

1987 ◽

pp. 527-535

Author(s):

T. S. Ananthanarayanan ◽

W. E. Mayo ◽

R. G. Rosemeier

Keyword(s):

High Resolution ◽

Rocking Curve ◽

X Ray

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X-Ray Diffraction Studies Under Non-Ambient Conditions: Application to Transition-Metal Dichalcogenide Solid Lubricants

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-1935-1_56 ◽

1987 ◽

pp. 465-471

Author(s):

E. F. Skelton ◽

A. W. Webb ◽

M. W. Schaefer ◽

D. Schiferl ◽

A. I. Katz ◽

...

Keyword(s):

Transition Metal ◽

Solid Lubricants ◽

Transition Metal Dichalcogenide ◽

Ambient Conditions ◽

X Ray Diffraction ◽

X Ray

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Lattice Parameter Determination using Synchrotron Powder Data

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-1935-1_45 ◽

1987 ◽

pp. 373-382 ◽

Cited By ~ 3

Author(s):

W. Parrish ◽

M. Hart ◽

T. C. Huang ◽

M. Bellotto

Keyword(s):

Lattice Parameter ◽

Parameter Determination

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On-Stream X-Ray Diffraction Analyzer for Mineral Concentrators

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-1935-1_44 ◽

1987 ◽

pp. 367-372

Author(s):

Heikki Sipilä ◽

Jouko Koskinen

Keyword(s):

X Ray Diffraction ◽

X Ray

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Wide Area Networking of XRF Generated Geochemical Data in a National Geological Survey

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-1935-1_33 ◽

1987 ◽

pp. 281-284

Author(s):

T. K. Smith

Keyword(s):

Geological Survey ◽

Wide Area ◽

Geochemical Data

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Layered Synthetic Microstructure in Sequential and Simultaneous X-Ray Spectrometry

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-1935-1_24 ◽

1987 ◽

pp. 201-211

Author(s):

Ad van Eenbergen ◽

Bernd Volbert

Keyword(s):

X Ray

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Use of Scattered Secondary Target Radiation in EDXRF Analysis: A Fundamental-Parameter Method for Matrix Correction

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-1935-1_20 ◽

1987 ◽

pp. 165-174 ◽

Cited By ~ 3

Author(s):

Tom O’Reilly ◽

Bi-Shia W. King

Keyword(s):

Parameter Method ◽

Fundamental Parameter ◽

Matrix Correction ◽

Secondary Target ◽

Edxrf Analysis ◽

Fundamental Parameter Method

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Background Intensities and their Utilization in Quantitative Analysis by Monochromatically Excited Energy-Dispersive X-Ray Fluorescence

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-1935-1_18 ◽

1987 ◽

pp. 143-151

Author(s):

Alessandra Rachetti ◽

Wolfhard Wegscheider

Keyword(s):

Quantitative Analysis ◽

Energy Dispersive ◽

X Ray

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Robotic Automation Applied to X-Ray Fluorescence Analysis

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-1935-1_12 ◽

1987 ◽

pp. 89-96

Author(s):

J. B. Cross ◽

R. D. Jones

Keyword(s):

Fluorescence Analysis ◽

X Ray ◽

Robotic Automation

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