2013 IEEE International Conference on Microelectronic Test Structures (ICMTS)
Latest Publications

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Published By IEEE

9781467348485, 9781467348454, 9781467348478

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

A new measurement set-up to investigate the charge trapping phenomena in RF MEMS packaged switches

2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2013.6528140 ◽

2013 ◽

Cited By ~ 7

Author(s):

M. Barbato ◽

V. Giliberto ◽

G. Meneghesso

Keyword(s):

Rf Mems ◽

Charge Trapping ◽

Set Up

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Efficient technique for Si validation of level shifters

2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2013.6528173 ◽

2013 ◽

Author(s):

P. Sharma ◽

B. Smith ◽

D. Hall ◽

M. Nelson ◽

U. Lohani

Keyword(s):

Efficient Technique ◽

Level Shifters

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Mosaic SRAM Cell TEGs with intentionally-added device variability for confirming the ratio-less SRAM operation

2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2013.6528174 ◽

2013 ◽

Cited By ~ 3

Author(s):

H. Okamura ◽

T. Saito ◽

H. Goto ◽

M. Yamamoto ◽

K. Nakamura

Keyword(s):

Sram Cell

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Comparison of electrical techniques for temperature evaluation in power MOS transistors

2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2013.6528156 ◽

2013 ◽

Cited By ~ 5

Author(s):

A. Ferrara ◽

P. G. Steeneken ◽

K. Reimann ◽

A. Heringa ◽

L. Yan ◽

...

Keyword(s):

Mos Transistors

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A novel BJT structure for high- performance analog circuit applications

2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2013.6528154 ◽

2013 ◽

Author(s):

Seon-Man Hwang ◽

Hyuk-Min Kwon ◽

Jae-Hyung Jang ◽

Ho-Young Kwak ◽

Sung-Kyu Kwon ◽

...

Keyword(s):

High Performance ◽

Analog Circuit

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Measurement and investigation of thermal properties of the on-chip metallization for integrated power technologies

2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2013.6528157 ◽

2013 ◽

Cited By ~ 6

Author(s):

M. Pfost ◽

C. Boianceanu ◽

I. Lascau ◽

D-I Simon ◽

S. Sosin

Keyword(s):

Thermal Properties ◽

On Chip

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A test structure for analysis of temperature distribution in CMOS LSI with sensing device array

2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2013.6528159 ◽

2013 ◽

Cited By ~ 6

Author(s):

T. Matsuda ◽

H. Hanai ◽

H. Iwata ◽

D. Kondo ◽

T. Hatakeyama ◽

...

Keyword(s):

Temperature Distribution ◽

Test Structure

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Investigation of devices of in-vivo energy harvesting through blood-flow-like excitation

2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2013.6528139 ◽

2013 ◽

Author(s):

R. O'Keeffe ◽

N. Jackson ◽

A. Mathewson ◽

K. G. McCarthy

Keyword(s):

Blood Flow ◽

Energy Harvesting

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Tr variance evaluation induced by probing pressure and its stress extraction methodology in 28nm High-K and Metal Gate process

2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2013.6528172 ◽

2013 ◽

Cited By ~ 2

Author(s):

T. Okagaki ◽

T. Hasegawa ◽

H. Takashino ◽

M. Fujii ◽

A. Tsuda ◽

...

Keyword(s):

Metal Gate ◽

High K

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Greek cross test structure for inkjet printed thin films

2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2013.6528166 ◽

2013 ◽

Cited By ~ 1

Author(s):

E. Diaz ◽

E. Ramon ◽

J. Carrabina

Keyword(s):

Thin Films ◽

Test Structure ◽

Cross Test

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2013 IEEE International Conference on Microelectronic Test Structures (ICMTS)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

A new measurement set-up to investigate the charge trapping phenomena in RF MEMS packaged switches

Efficient technique for Si validation of level shifters

Mosaic SRAM Cell TEGs with intentionally-added device variability for confirming the ratio-less SRAM operation

Comparison of electrical techniques for temperature evaluation in power MOS transistors

A novel BJT structure for high- performance analog circuit applications

Measurement and investigation of thermal properties of the on-chip metallization for integrated power technologies

A test structure for analysis of temperature distribution in CMOS LSI with sensing device array

Investigation of devices of in-vivo energy harvesting through blood-flow-like excitation

Tr variance evaluation induced by probing pressure and its stress extraction methodology in 28nm High-K and Metal Gate process

Greek cross test structure for inkjet printed thin films

2013 IEEE International Conference on Microelectronic Test Structures (ICMTS)
Latest Publications