Electrical Atomic Force Microscopy for Nanoelectronics - NanoScience and Technology
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Published By Springer International Publishing

9783030156114, 9783030156121
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Characterizing Ferroelectricity with an Atomic Force Microscopy: An All-Around Technique

2019 ◽  
pp. 173-203
Author(s):  
Simon Martin ◽  
Brice Gautier ◽  
Nicolas Baboux ◽  
Alexei Gruverman ◽  
Adrian Carretero-Genevrier ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Scanning Microwave Impedance Microscopy (sMIM) in Electronic and Quantum Materials

2019 ◽  
pp. 385-408
Author(s):  
Kurt A. Rubin ◽  
Yongliang Yang ◽  
Oskar Amster ◽  
David A. Scrymgeour ◽  
Shashank Misra
Keyword(s):  
Quantum Materials

Conductive AFM of 2D Materials and Heterostructures for Nanoelectronics

2019 ◽  
pp. 303-350 ◽  
Author(s):  
Filippo Giannazzo ◽  
Giuseppe Greco ◽  
Fabrizio Roccaforte ◽  
Chandreswar Mahata ◽  
Mario Lanza
Keyword(s):  
2D Materials ◽  
Conductive Afm

Mapping Conductance and Carrier Distributions in Confined Three-Dimensional Transistor Structures

2019 ◽  
pp. 71-106
Author(s):  
Andreas Schulze ◽  
Pierre Eyben ◽  
Jay Mody ◽  
Kristof Paredis ◽  
Lennaert Wouters ◽  
...  
Keyword(s):  
Three Dimensional
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