Applied Scanning Probe Methods V - NanoScience and Technology
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Published By Springer Berlin Heidelberg

9783540373155, 9783540373162

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Torsional Resonance Microscopy and Its Applications

Applied Scanning Probe Methods V - NanoScience and Technology ◽

10.1007/978-3-540-37316-2_6 ◽

2007 ◽

pp. 113-148 ◽

Cited By ~ 4

Author(s):

Chanmin Su ◽

Lin Huang ◽

Craig B. Prater ◽

Bharat Bhushan

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Near-Field Raman Spectroscopy and Imaging

Applied Scanning Probe Methods V - NanoScience and Technology ◽

10.1007/978-3-540-37316-2_10 ◽

2007 ◽

pp. 287-329 ◽

Cited By ~ 4

Author(s):

Pietro Giuseppe Gucciardi ◽

Sebastiano Trusso ◽

Cirino Vasi ◽

Salvatore Patanè ◽

Maria Allegrini

Keyword(s):

Raman Spectroscopy ◽

Near Field

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Integrated Cantilevers and Atomic Force Microscopes

Applied Scanning Probe Methods V - NanoScience and Technology ◽

10.1007/978-3-540-37316-2_1 ◽

2007 ◽

pp. 1-22 ◽

Cited By ~ 3

Author(s):

Sadik Hafizovic ◽

Kay-Uwe Kirstein ◽

Andreas Hierlemann

Keyword(s):

Atomic Force Microscopes ◽

Atomic Force

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Modeling of Tip-Cantilever Dynamics in Atomic Force Microscopy

Applied Scanning Probe Methods V - NanoScience and Technology ◽

10.1007/978-3-540-37316-2_7 ◽

2007 ◽

pp. 149-223 ◽

Cited By ~ 5

Author(s):

Yaxin Song ◽

Bharat Bhushan

Keyword(s):

Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force

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New AFM Developments to Study Elasticity and Adhesion at the Nanoscale

Applied Scanning Probe Methods V - NanoScience and Technology ◽

10.1007/978-3-540-37316-2_9 ◽

2007 ◽

pp. 269-286 ◽

Cited By ~ 4

Author(s):

Robert Szoszkiewicz ◽

Elisa Riedo

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Q-controlled Dynamic Force Microscopy in Air and Liquids

Applied Scanning Probe Methods V - NanoScience and Technology ◽

10.1007/978-3-540-37316-2_4 ◽

2007 ◽

pp. 75-97 ◽

Cited By ~ 1

Author(s):

Hendrik Hölscher ◽

Daniel Ebeling ◽

Udo D. Schwarz

Keyword(s):

Dynamic Force ◽

Force Microscopy

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Low-Noise Methods for Optical Measurements of Cantilever Deflections

Applied Scanning Probe Methods V - NanoScience and Technology ◽

10.1007/978-3-540-37316-2_3 ◽

2007 ◽

pp. 51-74 ◽

Cited By ~ 2

Author(s):

Tilman E. Schäffer

Keyword(s):

Low Noise ◽

Optical Measurements

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High-Frequency Dynamic Force Microscopy

Applied Scanning Probe Methods V - NanoScience and Technology ◽

10.1007/978-3-540-37316-2_5 ◽

2007 ◽

pp. 99-112

Author(s):

Hideki Kawakatsu

Keyword(s):

High Frequency ◽

Dynamic Force ◽

Force Microscopy

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Electrostatic Microscanner

Applied Scanning Probe Methods V - NanoScience and Technology ◽

10.1007/978-3-540-37316-2_2 ◽

2007 ◽

pp. 23-49

Author(s):

Yasuhisa Ando

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Combined Scanning Probe Techniques for In-Situ Electrochemical Imaging at a Nanoscale

Applied Scanning Probe Methods V - NanoScience and Technology ◽

10.1007/978-3-540-37316-2_8 ◽

2007 ◽

pp. 225-267 ◽

Cited By ~ 1

Author(s):

Justyna Wiedemair ◽

Boris Mizaikoff ◽

Christine Kranz

Keyword(s):

Scanning Probe ◽

Electrochemical Imaging

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Applied Scanning Probe Methods V - NanoScience and TechnologyLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer Berlin Heidelberg

Torsional Resonance Microscopy and Its Applications

Near-Field Raman Spectroscopy and Imaging

Integrated Cantilevers and Atomic Force Microscopes

Modeling of Tip-Cantilever Dynamics in Atomic Force Microscopy

New AFM Developments to Study Elasticity and Adhesion at the Nanoscale

Q-controlled Dynamic Force Microscopy in Air and Liquids

Low-Noise Methods for Optical Measurements of Cantilever Deflections

High-Frequency Dynamic Force Microscopy

Electrostatic Microscanner

Combined Scanning Probe Techniques for In-Situ Electrochemical Imaging at a Nanoscale

Applied Scanning Probe Methods V - NanoScience and Technology
Latest Publications