Ion Beam Surface Layer Analysis
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42

(FIVE YEARS 0)

H-INDEX

5

(FIVE YEARS 0)

Published By Springer US

9781461588788, 9781461588764

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An Apparatus for the Study of Ion and Photon Emission from Ion Bombarded Surfaces: I. Some Preliminary Results

Ion Beam Surface Layer Analysis ◽

10.1007/978-1-4615-8876-4_42 ◽

1976 ◽

pp. 483-494

Author(s):

R. J. MacDonald ◽

A. R. Bayly ◽

P. J. Martin

Keyword(s):

Photon Emission ◽

Preliminary Results

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Application of a High-Resolution Magnetic Spectrometer to Near-Surface Materials Analysis

Ion Beam Surface Layer Analysis ◽

10.1007/978-1-4615-8876-4_40 ◽

1976 ◽

pp. 457-469 ◽

Cited By ~ 4

Author(s):

James K. Hirvonen ◽

Graham K. Hubler

Keyword(s):

High Resolution ◽

Magnetic Spectrometer ◽

Near Surface ◽

Materials Analysis ◽

Surface Materials

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Investigation of an Amino Sugar-Like Compound from the Cell Walls of Bacteria Using Backscattering of MeV Particles

Ion Beam Surface Layer Analysis ◽

10.1007/978-1-4615-8876-4_38 ◽

1976 ◽

pp. 437-444

Author(s):

T. G. Finstad ◽

T. Olsen ◽

R. Reistad

Keyword(s):

Cell Walls ◽

Amino Sugar

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Lithium Ion Backscattering as a Novel Tool for the Characterization of Oxidized Phases of Aluminum Obtained from Industrial Anodization Procedures

Ion Beam Surface Layer Analysis ◽

10.1007/978-1-4615-8876-4_37 ◽

1976 ◽

pp. 425-435

Author(s):

J. P. Thomas ◽

A. Cachard ◽

M. Fallavier ◽

J. Tardy ◽

S. Marsaud

Keyword(s):

Lithium Ion ◽

Ion Backscattering

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The Analysis of Nickel and Chromium Migration Through Gold Layers

Ion Beam Surface Layer Analysis ◽

10.1007/978-1-4615-8876-4_35 ◽

1976 ◽

pp. 407-414 ◽

Cited By ~ 1

Author(s):

A. Barcz ◽

A. Turos ◽

L. Wieluński

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Analysis of Ga1-xAlxAs-GaAs Heteroepitaxial Layers by Proton Backscattering

Ion Beam Surface Layer Analysis ◽

10.1007/978-1-4615-8876-4_32 ◽

1976 ◽

pp. 375-384 ◽

Cited By ~ 1

Author(s):

K. Gamo ◽

T. Inada ◽

I. Samid ◽

C. P. Lee ◽

J. W. Mayer

Keyword(s):

Heteroepitaxial Layers

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Analyzing the Formation of a thin Compound Film by Taking Moments on Backscattering Spectra

Ion Beam Surface Layer Analysis ◽

10.1007/978-1-4615-8876-4_13 ◽

1976 ◽

pp. 149-161 ◽

Cited By ~ 2

Author(s):

R. F. Lever ◽

W. K. Chu

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Enhanced Sensitivity of Oxygen Detection by The 3.05 MeV (α, α) Elastic Scattering

Ion Beam Surface Layer Analysis ◽

10.1007/978-1-4615-8876-4_26 ◽

1976 ◽

pp. 303-312 ◽

Cited By ~ 10

Author(s):

G. Mezey ◽

J. Gyulai ◽

T. Nagy ◽

E. Kotai ◽

A. Manuaba

Keyword(s):

Elastic Scattering ◽

Oxygen Detection ◽

Enhanced Sensitivity

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Determination of Stopping Cross Sections by Rutherford Backscattering

Ion Beam Surface Layer Analysis ◽

10.1007/978-1-4615-8876-4_4 ◽

1976 ◽

pp. 33-46 ◽

Cited By ~ 7

Author(s):

B. M. U. Scherzer ◽

P. Børgesen ◽

M.-A. Nicolet ◽

J. W. Mayer

Keyword(s):

Cross Sections ◽

Rutherford Backscattering

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Investigation of CVD Tungsten Metallizations on Silicon by Backscattering

Ion Beam Surface Layer Analysis ◽

10.1007/978-1-4615-8876-4_30 ◽

1976 ◽

pp. 353-362 ◽

Cited By ~ 1

Author(s):

P. Eichinger ◽

H. Sauermann ◽

M. Wahl

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