High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test - Frontiers in Electronic Testing
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Published By Kluwer Academic Publishers

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Conclusions

High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test - Frontiers in Electronic Testing ◽

10.1007/0-306-47972-9_15 ◽

2005 ◽

pp. 203-206

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Multi-Port Memories

High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test - Frontiers in Electronic Testing ◽

10.1007/0-306-47972-9_3 ◽

2005 ◽

pp. 47-56

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Memory Faults

High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test - Frontiers in Electronic Testing ◽

10.1007/0-306-47972-9_8 ◽

2005 ◽

pp. 103-126

Keyword(s):

Memory Faults

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State Machine BIST

High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test - Frontiers in Electronic Testing ◽

10.1007/0-306-47972-9_11 ◽

2005 ◽

pp. 163-172

Keyword(s):

State Machine

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BIST and Redundancy

High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test - Frontiers in Electronic Testing ◽

10.1007/0-306-47972-9_13 ◽

2005 ◽

pp. 183-193

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Silicon On Insulator Memories

High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test - Frontiers in Electronic Testing ◽

10.1007/0-306-47972-9_4 ◽

2005 ◽

pp. 57-66

Keyword(s):

Silicon On Insulator

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Memory Patterns

High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test - Frontiers in Electronic Testing ◽

10.1007/0-306-47972-9_9 ◽

2005 ◽

pp. 127-148

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Non-Volatile Memories

High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test - Frontiers in Electronic Testing ◽

10.1007/0-306-47972-9_7 ◽

2005 ◽

pp. 89-101

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Opening Pandora’s Box

High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test - Frontiers in Electronic Testing ◽

10.1007/0-306-47972-9_1 ◽

2005 ◽

pp. 1-15

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BIST Concepts

High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test - Frontiers in Electronic Testing ◽

10.1007/0-306-47972-9_10 ◽

2005 ◽

pp. 149-162

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