Physical Measurement and Analysis of Thin Films
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Published By Springer US

9781489959126, 9781489959102

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The Characterization of Solid Thin Films and Surfaces By Electron Microscopy and Diffraction

Physical Measurement and Analysis of Thin Films ◽

10.1007/978-1-4899-5910-2_5 ◽

1969 ◽

pp. 105-137 ◽

Cited By ~ 1

Author(s):

R. B. Marcus

Keyword(s):

Electron Microscopy ◽

Thin Films ◽

Solid Thin Films

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Density Determination of Sputtered Tantalum Films By a Beta-Backscatter Technique

Physical Measurement and Analysis of Thin Films ◽

10.1007/978-1-4899-5910-2_4 ◽

1969 ◽

pp. 93-104

Author(s):

Richard Brown

Keyword(s):

Density Determination ◽

Tantalum Films

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Chemical and Structural Evaluation of Thin Glass Films

Physical Measurement and Analysis of Thin Films ◽

10.1007/978-1-4899-5910-2_8 ◽

1969 ◽

pp. 168-192 ◽

Cited By ~ 3

Author(s):

W. A. Pliskin

Keyword(s):

Thin Glass ◽

Structural Evaluation ◽

Glass Films

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The Emission-Spectrographic and Atomic-Absorption Analyses of Metallic Thin Films

Physical Measurement and Analysis of Thin Films ◽

10.1007/978-1-4899-5910-2_6 ◽

1969 ◽

pp. 138-147 ◽

Cited By ~ 2

Author(s):

J. D. Nohe

Keyword(s):

Thin Films ◽

Atomic Absorption ◽

Metallic Thin Films

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X-Ray Fluorescence and Electron Microprobe Techniques for Determination of Thin-Film Thicknesses

Physical Measurement and Analysis of Thin Films ◽

10.1007/978-1-4899-5910-2_3 ◽

1969 ◽

pp. 83-92 ◽

Cited By ~ 2

Author(s):

James E. Cline

Keyword(s):

Thin Film ◽

Electron Microprobe ◽

X Ray

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RF Spark Source Mass Spectrometry for the Analysis of Surface Films

Physical Measurement and Analysis of Thin Films ◽

10.1007/978-1-4899-5910-2_7 ◽

1969 ◽

pp. 148-167 ◽

Cited By ~ 1

Author(s):

D. L. Malm

Keyword(s):

Mass Spectrometry ◽

Surface Films ◽

Spark Source Mass Spectrometry ◽

Source Mass

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Nondestructive Optical Techniques for Thin-Film Thickness Measurements

Physical Measurement and Analysis of Thin Films ◽

10.1007/978-1-4899-5910-2_1 ◽

1969 ◽

pp. 1-34

Author(s):

W. A. Pliskin

Keyword(s):

Thin Film ◽

Film Thickness ◽

Thin Film Thickness ◽

Optical Techniques ◽

Thickness Measurements

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A Review of X-Ray Methods for Investigating Thin Films And Platings

Physical Measurement and Analysis of Thin Films ◽

10.1007/978-1-4899-5910-2_2 ◽

1969 ◽

pp. 35-82

Author(s):

Eugene P. Bertin

Keyword(s):

Thin Films ◽

X Ray ◽

Ray Methods

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