Next-Generation Spectroscopic Technologies XIII
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Published By SPIE

9781510635579, 9781510635586
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Stress analysis of Si chip sidewalls using micro-Raman spectroscopy

2020 ◽  
Author(s):  
Martin De Biasio ◽  
Martin Kraft ◽  
Richard Ong ◽  
Christian Seifert ◽  
Manfred Ossiander ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Stress Analysis ◽  
Micro Raman Spectroscopy

Deep UV Raman and fluorescence spectroscopy for real-time in-situ process monitoring

2020 ◽  
Author(s):  
William F. Hug ◽  
Quoc Nguyen ◽  
Michael R. Reid ◽  
Kripa K. Sijapati ◽  
Ray D. Reid
Keyword(s):  
Fluorescence Spectroscopy ◽  
Real Time ◽  
Process Monitoring ◽  
Uv Raman ◽  
Deep Uv

UTC-PD-integrated HEMT for optical-to-sub-terahertz carrier frequency down-conversion

2020 ◽  
Author(s):  
Akira Satou ◽  
Kazuki Nishimura ◽  
Yuya Omori ◽  
Tomotaka Hosotani ◽  
Katsumi Iwatsuki ◽  
...  
Keyword(s):  
Carrier Frequency ◽  
Down Conversion
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