Proceedings ED&TC European Design and Test Conference
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Future of testing: Reintegration of design, testing and manufacturing

Proceedings ED&TC European Design and Test Conference ◽

10.1109/edtc.1996.494116 ◽

1996 ◽

Cited By ~ 9

Author(s):

W. Maly

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Formal specification of a reactive system: an exercise in VHDL, LOTOS and UNITY

Proceedings ED&TC European Design and Test Conference ◽

10.1109/edtc.1996.494371 ◽

1996 ◽

Author(s):

L. Pierre

Keyword(s):

Formal Specification ◽

Reactive System

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System fault diagnosis based on a fuzzy qualitative approach

Proceedings ED&TC European Design and Test Conference ◽

10.1109/edtc.1996.494380 ◽

1996 ◽

Cited By ~ 3

Author(s):

M.H. Touati ◽

F. Mohamed ◽

M. Marzouki

Keyword(s):

Fault Diagnosis ◽

Qualitative Approach

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The use of microelectronics for future telecom and multimedia systems

Proceedings ED&TC European Design and Test Conference ◽

10.1109/edtc.1996.494121 ◽

1996 ◽

Cited By ~ 2

Author(s):

J. Wenin ◽

G. Van Wauwe ◽

M. Genoe ◽

D. Sallaerts

Keyword(s):

Multimedia Systems

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Design of test modules for the analysis of MCM interconnects

Proceedings ED&TC European Design and Test Conference ◽

10.1109/edtc.1996.494378 ◽

1996 ◽

Author(s):

C. Truzzi ◽

E. Beyne ◽

E. Ringoot

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Author index

Proceedings ED&TC European Design and Test Conference ◽

10.1109/edtc.1996.494384 ◽

1996 ◽

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An automated design environment for micromechanical sensors

Proceedings ED&TC European Design and Test Conference ◽

10.1109/edtc.1996.494381 ◽

1996 ◽

Author(s):

A. Murthi ◽

F. Rocaries

Keyword(s):

Automated Design ◽

Design Environment ◽

Micromechanical Sensors

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Methods and tools for the design of electrostatic micromotors

Proceedings ED&TC European Design and Test Conference ◽

10.1109/edtc.1996.494382 ◽

1996 ◽

Cited By ~ 1

Author(s):

T.B. Johansson ◽

K. Hameyer ◽

R. Belmans

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Generalized Recognition Of Gates: a VLSI abstraction tool

Proceedings ED&TC European Design and Test Conference ◽

10.1109/edtc.1996.494372 ◽

1996 ◽

Cited By ~ 1

Author(s):

J.B. Guignet

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Silicon technology: risks, opportunities, and challenges

Proceedings ED&TC European Design and Test Conference ◽

10.1109/edtc.1996.494115 ◽

1996 ◽

Author(s):

H. Jacobs

Keyword(s):

Silicon Technology

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Proceedings ED&TC European Design and Test ConferenceLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Future of testing: Reintegration of design, testing and manufacturing

Formal specification of a reactive system: an exercise in VHDL, LOTOS and UNITY

System fault diagnosis based on a fuzzy qualitative approach

The use of microelectronics for future telecom and multimedia systems

Design of test modules for the analysis of MCM interconnects

Author index

An automated design environment for micromechanical sensors

Methods and tools for the design of electrostatic micromotors

Generalized Recognition Of Gates: a VLSI abstraction tool

Silicon technology: risks, opportunities, and challenges

Proceedings ED&TC European Design and Test Conference
Latest Publications