1999 GaAs Reliability Workshop. Proceedings (Cat. No.00TH8459)
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Preventing degradation of GaAs devices by the use of getter

1999 GaAs Reliability Workshop. Proceedings (Cat. No.00TH8459) ◽

10.1109/gaasrw.1999.874168 ◽

2003 ◽

Author(s):

R. Mohanty ◽

K. Gilleo

Keyword(s):

Gaas Devices

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ESD sensitivity study of various diode protection circuits implemented in a production 1 μm GaAs HBT technology

1999 GaAs Reliability Workshop. Proceedings (Cat. No.00TH8459) ◽

10.1109/gaasrw.1999.874179 ◽

2003 ◽

Cited By ~ 3

Author(s):

F.M. Yamada ◽

A.K. Oki ◽

E.N. Kaneshiro ◽

M.D. Lammert ◽

A.L. Gutierrez-Aitken ◽

...

Keyword(s):

Sensitivity Study ◽

Protection Circuits

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Reliability performance of components and ICs from a production 1 μm GaAs HBT process

1999 GaAs Reliability Workshop. Proceedings (Cat. No.00TH8459) ◽

10.1109/gaasrw.1999.874171 ◽

2003 ◽

Cited By ~ 7

Author(s):

F.M. Yamada ◽

A.K. Oki ◽

D.C. Streit ◽

B.L. Hikin ◽

E.N. Kaneshiro ◽

...

Keyword(s):

Reliability Performance

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The effect of gate and recess scaling on the gate-drain breakdown and hot-electron reliability of AlGaAs/GaAs power HFETs

1999 GaAs Reliability Workshop. Proceedings (Cat. No.00TH8459) ◽

10.1109/gaasrw.1999.874153 ◽

2003 ◽

Cited By ~ 1

Author(s):

R. Menozzi ◽

D. Dieci ◽

G. Sozzi ◽

T. Tomasi ◽

C. Lanzieri

Keyword(s):

Hot Electron

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Automated WLR testing of HBT's

1999 GaAs Reliability Workshop. Proceedings (Cat. No.00TH8459) ◽

10.1109/gaasrw.1999.874099 ◽

2003 ◽

Cited By ~ 1

Author(s):

E. Sabin ◽

S. Scarpulla ◽

S. Dacus

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Step-stress accelerated testing in ion implanted GaAs self-aligned gate MESFETs

1999 GaAs Reliability Workshop. Proceedings (Cat. No.00TH8459) ◽

10.1109/gaasrw.1999.874095 ◽

2003 ◽

Cited By ~ 1

Author(s):

F. Gao ◽

P. Ersland

Keyword(s):

Accelerated Testing ◽

Ion Implanted

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Channel temperature measurement of GaAs devices using an atomic force microscope

1999 GaAs Reliability Workshop. Proceedings (Cat. No.00TH8459) ◽

10.1109/gaasrw.1999.874092 ◽

2003 ◽

Cited By ~ 7

Author(s):

W.T. Anderson ◽

J.A. Mittereder ◽

J.A. Roussos

Keyword(s):

Atomic Force Microscope ◽

Temperature Measurement ◽

Atomic Force ◽

Gaas Devices ◽

Channel Temperature

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Hydrogen sensitivity of GaAs HEMT amplifiers: the effect of bias mode

1999 GaAs Reliability Workshop. Proceedings (Cat. No.00TH8459) ◽

10.1109/gaasrw.1999.874167 ◽

2003 ◽

Author(s):

D.C. Eng ◽

J. Scarpulla

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Reliability testing of 0.1 μm GaAs pseudomorphic HEMT MMIC amplifiers

1999 GaAs Reliability Workshop. Proceedings (Cat. No.00TH8459) ◽

10.1109/gaasrw.1999.874166 ◽

2003 ◽

Cited By ~ 2

Author(s):

D.L. Leung ◽

Y.C. Chou ◽

C.S. Wu ◽

R. Kono ◽

J. Scarpulla ◽

...

Keyword(s):

Reliability Testing

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Investigation on GaAs power MESFETs submitted to RF life-test by LF noise and drain current transient analysis

1999 GaAs Reliability Workshop. Proceedings (Cat. No.00TH8459) ◽

10.1109/gaasrw.1999.874163 ◽

2003 ◽

Cited By ~ 3

Author(s):

N. Saysset-Malbert ◽

B. Lambert ◽

C. Maneux ◽

N. Labat ◽

A. Touboul ◽

...

Keyword(s):

Transient Analysis ◽

Drain Current ◽

Current Transient ◽

Life Test

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1999 GaAs Reliability Workshop. Proceedings (Cat. No.00TH8459)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Preventing degradation of GaAs devices by the use of getter

ESD sensitivity study of various diode protection circuits implemented in a production 1 μm GaAs HBT technology

Reliability performance of components and ICs from a production 1 μm GaAs HBT process

The effect of gate and recess scaling on the gate-drain breakdown and hot-electron reliability of AlGaAs/GaAs power HFETs

Automated WLR testing of HBT's

Step-stress accelerated testing in ion implanted GaAs self-aligned gate MESFETs

Channel temperature measurement of GaAs devices using an atomic force microscope

Hydrogen sensitivity of GaAs HEMT amplifiers: the effect of bias mode

Reliability testing of 0.1 μm GaAs pseudomorphic HEMT MMIC amplifiers

Investigation on GaAs power MESFETs submitted to RF life-test by LF noise and drain current transient analysis

1999 GaAs Reliability Workshop. Proceedings (Cat. No.00TH8459)
Latest Publications