Proceedings of 1995 IEEE Nuclear and Space Radiation Effects Conference (NSREC'95)
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OPPORTUNITIES FOR SEE TESTING AND RESEARCH AT THE CHALK RIVER TASCC HEAVY ION FACILITY

Proceedings of 1995 IEEE Nuclear and Space Radiation Effects Conference (NSREC'95) ◽

10.1109/redw.1995.483408 ◽

2005 ◽

Cited By ~ 1

Author(s):

H.R. Andrews ◽

J.S. Geiger ◽

V.T. Koslowsky ◽

H. Schmeing ◽

G.R. Mitchel

Keyword(s):

Heavy Ion

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TRENDS IN DEVICE SEE SUSCEPTIBILITY FROM HEAVY IONS

Proceedings of 1995 IEEE Nuclear and Space Radiation Effects Conference (NSREC'95) ◽

10.1109/redw.1995.483258 ◽

2005 ◽

Cited By ~ 8

Author(s):

D.K. Nichols ◽

J.R. Coss ◽

K.P. McCarty ◽

H.R. Schwartz ◽

G.M. Swift ◽

...

Keyword(s):

Heavy Ions

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Rad-hard successive detection microwave logarithmic amplifiers employing GaAs monolithic chips using heterojunction bipolar transistors

Proceedings of 1995 IEEE Nuclear and Space Radiation Effects Conference (NSREC'95) ◽

10.1109/redw.1995.483401 ◽

2002 ◽

Author(s):

L. Silverman ◽

G. Kuenher ◽

M. Jupina

Keyword(s):

Heterojunction Bipolar Transistors ◽

Bipolar Transistors

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Confirmation of calculated error rates in a logic circuit using a pulsed laser

Proceedings of 1995 IEEE Nuclear and Space Radiation Effects Conference (NSREC'95) ◽

10.1109/redw.1995.483374 ◽

2002 ◽

Cited By ~ 1

Author(s):

S. Buchner ◽

J. Melinger ◽

D. McMorrow ◽

M. Baze ◽

W. Bartholet

Keyword(s):

Pulsed Laser ◽

Error Rates ◽

Logic Circuit

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Total dose characterization of the PACE 1750A microprocessor chipset

Proceedings of 1995 IEEE Nuclear and Space Radiation Effects Conference (NSREC'95) ◽

10.1109/redw.1995.483400 ◽

2002 ◽

Cited By ~ 1

Author(s):

M. Regula ◽

O. Pedersen ◽

R.R. Konegen

Keyword(s):

Total Dose

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PL-GEOSpace: three-dimensional visualization of the dynamic space environment

Proceedings of 1995 IEEE Nuclear and Space Radiation Effects Conference (NSREC'95) ◽

10.1109/redw.1995.483405 ◽

2002 ◽

Cited By ~ 1

Author(s):

G.P. Ginet ◽

R. Biasca ◽

M. Tautz

Keyword(s):

Three Dimensional ◽

Space Environment

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Heavy ion, proton and Co-60 radiation evaluation of 16 Mbit DRAM memories for space application

Proceedings of 1995 IEEE Nuclear and Space Radiation Effects Conference (NSREC'95) ◽

10.1109/redw.1995.483375 ◽

2002 ◽

Cited By ~ 12

Author(s):

R. Harboe-Sorensen ◽

R. Muller ◽

S. Fraenkel

Keyword(s):

Heavy Ion ◽

Space Application ◽

Ion Proton

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Low noise and high tolerance to radiation effects of complementary bipolar SOI IC technology

Proceedings of 1995 IEEE Nuclear and Space Radiation Effects Conference (NSREC'95) ◽

10.1109/redw.1995.483402 ◽

2002 ◽

Cited By ~ 1

Author(s):

A.H. Pawlikiewicz ◽

A. Bishop ◽

R. Jerome

Keyword(s):

Radiation Effects ◽

Low Noise ◽

High Tolerance ◽

Ic Technology

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CRRES electron omnidirectional flux models and CRRESELE utility

Proceedings of 1995 IEEE Nuclear and Space Radiation Effects Conference (NSREC'95) ◽

10.1109/redw.1995.483404 ◽

2002 ◽

Cited By ~ 3

Author(s):

D.H. Brautigam ◽

J.T. Bell

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Investigations of dose rate effects on CMOS submicronic technologies

Proceedings of 1995 IEEE Nuclear and Space Radiation Effects Conference (NSREC'95) ◽

10.1109/redw.1995.483403 ◽

2002 ◽

Cited By ~ 4

Author(s):

T. Corbiere ◽

J.L. Venturin

Keyword(s):

Dose Rate ◽

Dose Rate Effects ◽

Rate Effects

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Proceedings of 1995 IEEE Nuclear and Space Radiation Effects Conference (NSREC'95)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

OPPORTUNITIES FOR SEE TESTING AND RESEARCH AT THE CHALK RIVER TASCC HEAVY ION FACILITY

TRENDS IN DEVICE SEE SUSCEPTIBILITY FROM HEAVY IONS

Rad-hard successive detection microwave logarithmic amplifiers employing GaAs monolithic chips using heterojunction bipolar transistors

Confirmation of calculated error rates in a logic circuit using a pulsed laser

Total dose characterization of the PACE 1750A microprocessor chipset

PL-GEOSpace: three-dimensional visualization of the dynamic space environment

Heavy ion, proton and Co-60 radiation evaluation of 16 Mbit DRAM memories for space application

Low noise and high tolerance to radiation effects of complementary bipolar SOI IC technology

CRRES electron omnidirectional flux models and CRRESELE utility

Investigations of dose rate effects on CMOS submicronic technologies

Proceedings of 1995 IEEE Nuclear and Space Radiation Effects Conference (NSREC'95)
Latest Publications