2009 73rd ARFTG Microwave Measurement Conference
Latest Publications

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Published By IEEE

9781424434428

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Impact of waveguide aperture dimensions and misalignment on the calibrated performance of a network analyzer from 140 to 325GHz

2009 73rd ARFTG Microwave Measurement Conference ◽

10.1109/arftg.2009.5278062 ◽

2009 ◽

Author(s):

L. B. Lok ◽

S. Singh ◽

A. Wilson ◽

K. Elgaid

Keyword(s):

Network Analyzer

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Traceability to national standards for S-parameter measurements of waveguide devices from 110 GHz to 170 GHz

2009 73rd ARFTG Microwave Measurement Conference ◽

10.1109/arftg.2009.5278079 ◽

2009 ◽

Cited By ~ 9

Author(s):

Roland Clarke ◽

Roger Pollard ◽

Nick Ridler ◽

Martin Salter ◽

Alan Wilson

Keyword(s):

National Standards ◽

Waveguide Devices ◽

S Parameter

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Design of inline power sensors and performance evaluation

2009 73rd ARFTG Microwave Measurement Conference ◽

10.1109/arftg.2009.5278069 ◽

2009 ◽

Author(s):

Yeou-Song Lee ◽

Michael Neumann

Keyword(s):

Performance Evaluation ◽

And Performance

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Two-tier L-L de-embedding method for S-parameters measurements of devices mounted in test fixture

2009 73rd ARFTG Microwave Measurement Conference ◽

10.1109/arftg.2009.5278073 ◽

2009 ◽

Cited By ~ 3

Author(s):

J. E. Zuniga-Juarez ◽

J. A. Reynoso-Hernandez ◽

J. R. Loo-Yau

Keyword(s):

Embedding Method ◽

Test Fixture ◽

S Parameters

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On the High Frequency de-embedding& modeling of FET devices

2009 73rd ARFTG Microwave Measurement Conference ◽

10.1109/arftg.2009.5278076 ◽

2009 ◽

Cited By ~ 2

Author(s):

I. Angelov ◽

K. Kanaya ◽

S. Goto ◽

M. Abbasi

Keyword(s):

High Frequency

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Title page

2009 73rd ARFTG Microwave Measurement Conference ◽

10.1109/arftg.2009.5278061 ◽

2009 ◽

Keyword(s):

Title Page

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A method for estimating the complex residual errors of a VNA in one-port measurements

2009 73rd ARFTG Microwave Measurement Conference ◽

10.1109/arftg.2009.5278068 ◽

2009 ◽

Cited By ~ 2

Author(s):

Jeong-Hwan Kim ◽

Jin-Seob Kang ◽

Dae-Chan Kim

Keyword(s):

Residual Errors

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Modeling the baseband output envelope of a Microwave detector

2009 73rd ARFTG Microwave Measurement Conference ◽

10.1109/arftg.2009.5278071 ◽

2009 ◽

Cited By ~ 1

Author(s):

Liesbeth Gomme ◽

Yves Rolain ◽

Johan Schoukens ◽

Rik Pintelon

Keyword(s):

Microwave Detector

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Nonlinear validation of arbitrary load X-parameter and measurement-based device models

2009 73rd ARFTG Microwave Measurement Conference ◽

10.1109/arftg.2009.5278063 ◽

2009 ◽

Cited By ~ 10

Author(s):

Daniel Gunyan ◽

Jason Horn ◽

Jianjun Xu ◽

David E. Root

Keyword(s):

Arbitrary Load

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Bursts of Pulses for time domain large signal measurements

2009 73rd ARFTG Microwave Measurement Conference ◽

10.1109/arftg.2009.5278067 ◽

2009 ◽

Cited By ~ 9

Author(s):

Jad Faraj ◽

Guillaume Callet ◽

Fabien De Groote ◽

Jan Verspecht ◽

Raymond Quere ◽

...

Keyword(s):

Time Domain ◽

Large Signal

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2009 73rd ARFTG Microwave Measurement ConferenceLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Impact of waveguide aperture dimensions and misalignment on the calibrated performance of a network analyzer from 140 to 325GHz

Traceability to national standards for S-parameter measurements of waveguide devices from 110 GHz to 170 GHz

Design of inline power sensors and performance evaluation

Two-tier L-L de-embedding method for S-parameters measurements of devices mounted in test fixture

On the High Frequency de-embedding& modeling of FET devices

Title page

A method for estimating the complex residual errors of a VNA in one-port measurements

Modeling the baseband output envelope of a Microwave detector

Nonlinear validation of arbitrary load X-parameter and measurement-based device models

Bursts of Pulses for time domain large signal measurements

2009 73rd ARFTG Microwave Measurement Conference
Latest Publications