Microscopy Methods in Nanomaterials Characterization
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Scanning Electron Microscopy Under Gaseous Environment

Microscopy Methods in Nanomaterials Characterization ◽

10.1016/b978-0-323-46141-2.00003-1 ◽

2017 ◽

pp. 85-103

Author(s):

Zahava Barkay

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Gaseous Environment ◽

Scanning Electron

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Characterization of Materials, Nanomaterials, and Thin Films by Nanoindentation

Microscopy Methods in Nanomaterials Characterization ◽

10.1016/b978-0-323-46141-2.00006-7 ◽

2017 ◽

pp. 165-239 ◽

Cited By ~ 2

Author(s):

Zhong Hu

Keyword(s):

Thin Films ◽

Characterization Of Materials

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Auger Electron Spectroscopy

Microscopy Methods in Nanomaterials Characterization ◽

10.1016/b978-0-323-46141-2.00011-0 ◽

2017 ◽

pp. 363-381 ◽

Cited By ~ 2

Author(s):

Arkady M. Ilyin

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron

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Superresolution Optical Microscopy

Microscopy Methods in Nanomaterials Characterization ◽

10.1016/b978-0-323-46141-2.00007-9 ◽

2017 ◽

pp. 241-291

Author(s):

Yue Fang ◽

Yujia Huang ◽

Shaocong Liu ◽

Cuifang Kuang ◽

Xu Liu

Keyword(s):

Optical Microscopy

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Transmission Electron Microscopy of Nanostructures

Microscopy Methods in Nanomaterials Characterization ◽

10.1016/b978-0-323-46141-2.00004-3 ◽

2017 ◽

pp. 105-134 ◽

Cited By ~ 4

Author(s):

Thomas Walther

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Transmission Electron

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List of Contributors

Microscopy Methods in Nanomaterials Characterization ◽

10.1016/b978-0-323-46141-2.01002-6 ◽

2017 ◽

pp. xiii-xiv

Author(s):

Rameshwar Adhikari ◽

Gudimalla AppaRao ◽

Zahava Barkay ◽

Anjali Bishnoi ◽

Mauro Ciappa ◽

...

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Small-Angle Neutron Scattering (SANS)

Microscopy Methods in Nanomaterials Characterization ◽

10.1016/b978-0-323-46141-2.00010-9 ◽

2017 ◽

pp. 339-361 ◽

Cited By ~ 2

Author(s):

Aristeidis Papagiannopoulos

Keyword(s):

Neutron Scattering ◽

Small Angle ◽

Small Angle Neutron Scattering

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Synthesis of Scanning Electron Microscopy Images of Nanostructures by High-Performance Monte Carlo Modeling

Microscopy Methods in Nanomaterials Characterization ◽

10.1016/b978-0-323-46141-2.00002-x ◽

2017 ◽

pp. 31-83

Author(s):

Mauro Ciappa

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Monte Carlo ◽

High Performance ◽

Monte Carlo Modeling ◽

Microscopy Images ◽

Scanning Electron

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Wide-Angle X-ray Diffraction (WXRD)

Microscopy Methods in Nanomaterials Characterization ◽

10.1016/b978-0-323-46141-2.00009-2 ◽

2017 ◽

pp. 313-337 ◽

Cited By ~ 3

Author(s):

Anjali Bishnoi ◽

Sunil Kumar ◽

Nirav Joshi

Keyword(s):

Wide Angle ◽

X Ray Diffraction ◽

X Ray

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Index

Microscopy Methods in Nanomaterials Characterization ◽

10.1016/b978-0-323-46141-2.18001-0 ◽

2017 ◽

pp. 407-414

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Microscopy Methods in Nanomaterials CharacterizationLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Elsevier

Scanning Electron Microscopy Under Gaseous Environment

Characterization of Materials, Nanomaterials, and Thin Films by Nanoindentation

Auger Electron Spectroscopy

Superresolution Optical Microscopy

Transmission Electron Microscopy of Nanostructures

List of Contributors

Small-Angle Neutron Scattering (SANS)

Synthesis of Scanning Electron Microscopy Images of Nanostructures by High-Performance Monte Carlo Modeling

Wide-Angle X-ray Diffraction (WXRD)

Index

Microscopy Methods in Nanomaterials Characterization
Latest Publications