Defect and Diffusion Forum - Defects and Diffusion in Semiconductors - an Annual Retrospective VIII
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Published By Trans Tech Publications Ltd.

3908451167

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Identification of the Nature of Deep Trap States in Molecular Beam Epitaxially Grown Gallium Arsenide

Defect and Diffusion Forum - Defects and Diffusion in Semiconductors - an Annual Retrospective VIII ◽

10.4028/3-908451-16-7.51 ◽

2005 ◽

pp. 51-0

Author(s):

N.C. Halder

Keyword(s):

Gallium Arsenide ◽

Molecular Beam ◽

Deep Trap ◽

Trap States

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Growth and Characterization of Boron-Doped Si1-x-yGexCy Layers Grown by Reduced Pressure Chemical Vapor Deposition

Defect and Diffusion Forum - Defects and Diffusion in Semiconductors - an Annual Retrospective VIII ◽

10.4028/3-908451-16-7.39 ◽

2005 ◽

pp. 39-50

Author(s):

H.H. Radamson ◽

J. Hållstedt

Keyword(s):

Chemical Vapor Deposition ◽

Vapor Deposition ◽

Chemical Vapor ◽

Reduced Pressure ◽

Boron Doped ◽

Pressure Chemical

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The Size Distribution of Defect Clusters in n-Si (FZ, Cz), Irradiated by Fast Neutrons

Defect and Diffusion Forum - Defects and Diffusion in Semiconductors - an Annual Retrospective VIII ◽

10.4028/3-908451-16-7.1 ◽

2005 ◽

pp. 1-8

Author(s):

A.P. Dolgolenko ◽

G.P. Gaidar

Keyword(s):

Size Distribution ◽

Fast Neutrons ◽

Defect Clusters

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Role of Diffusion in the Shaping of the High-Absorption State in a Resonatorless Exciton Bistable System

Defect and Diffusion Forum - Defects and Diffusion in Semiconductors - an Annual Retrospective VIII ◽

10.4028/3-908451-16-7.9 ◽

2005 ◽

pp. 9-14

Author(s):

Yuriy V. Gudyma ◽

Ivanna V. Kruglenko

Keyword(s):

Bistable System ◽

High Absorption

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DFT Analysis of the Indium-Antimony-Vacancy Cluster in Silicon

Defect and Diffusion Forum - Defects and Diffusion in Semiconductors - an Annual Retrospective VIII ◽

10.4028/3-908451-16-7.29 ◽

2005 ◽

pp. 29-38

Author(s):

M.M. De Souza ◽

J.P. Goss

Keyword(s):

Vacancy Cluster

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Oxygen Enrichment of Silicon Wafer by Ion Implantation Method and Fabrication of Surface Barrier Detectors

Defect and Diffusion Forum - Defects and Diffusion in Semiconductors - an Annual Retrospective VIII ◽

10.4028/3-908451-16-7.23 ◽

2005 ◽

pp. 23-28

Author(s):

S.K. Chaudhuri ◽

P.V. Rajesh ◽

S.S. Ghugre ◽

D. Das

Keyword(s):

Ion Implantation ◽

Silicon Wafer ◽

Oxygen Enrichment ◽

Surface Barrier ◽

Barrier Detectors ◽

Implantation Method

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On the Interaction of Dislocations with Impurities in Silicon

Defect and Diffusion Forum - Defects and Diffusion in Semiconductors - an Annual Retrospective VIII ◽

10.4028/3-908451-16-7.15 ◽

2005 ◽

pp. 15-22

Author(s):

Daniela Cavalcoli ◽

Anna Cavallini

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Defect and Diffusion Forum - Defects and Diffusion in Semiconductors - an Annual Retrospective VIIILatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Trans Tech Publications Ltd.

Identification of the Nature of Deep Trap States in Molecular Beam Epitaxially Grown Gallium Arsenide

Growth and Characterization of Boron-Doped Si1-x-yGexCy Layers Grown by Reduced Pressure Chemical Vapor Deposition

The Size Distribution of Defect Clusters in n-Si (FZ, Cz), Irradiated by Fast Neutrons

Role of Diffusion in the Shaping of the High-Absorption State in a Resonatorless Exciton Bistable System

DFT Analysis of the Indium-Antimony-Vacancy Cluster in Silicon

Oxygen Enrichment of Silicon Wafer by Ion Implantation Method and Fabrication of Surface Barrier Detectors

On the Interaction of Dislocations with Impurities in Silicon

Defect and Diffusion Forum - Defects and Diffusion in Semiconductors - an Annual Retrospective VIII
Latest Publications