The Physics of SiO2 and its Interfaces
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Published By Elsevier

9780080230498

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ELECTRONIC PROPERTIES OF VITREOUS SILICON DIOXIDE

The Physics of SiO2 and its Interfaces ◽

10.1016/b978-0-08-023049-8.50005-1 ◽

1978 ◽

pp. 1-13 ◽

Cited By ~ 4

Author(s):

N.F. Mott

Keyword(s):

Silicon Dioxide ◽

Electronic Properties

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THE PROPERTIES OF ELECTRON AND HOLE TRAPS IN THERMAL SILICON DIOXIDE LAYERS GROWN ON SILICON

The Physics of SiO2 and its Interfaces ◽

10.1016/b978-0-08-023049-8.50034-8 ◽

1978 ◽

pp. 160-178 ◽

Cited By ~ 90

Author(s):

D.J. DiMaria

Keyword(s):

Silicon Dioxide ◽

Electron And Hole Traps

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NEUTRON DIFFRACTION BY VITREOUS SILICA

The Physics of SiO2 and its Interfaces ◽

10.1016/b978-0-08-023049-8.50029-4 ◽

1978 ◽

pp. 133-138 ◽

Cited By ~ 6

Author(s):

Adrian C Wright ◽

Roger N Sinclair

Keyword(s):

Neutron Diffraction ◽

Vitreous Silica

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MOS SOLAR CELL AS A TOOL TO STUDY THE TRANSITION REGION ASSOCIATED WITH ULTRA THIN FILMS OF SiOx

The Physics of SiO2 and its Interfaces ◽

10.1016/b978-0-08-023049-8.50073-7 ◽

1978 ◽

pp. 396-400 ◽

Cited By ~ 2

Author(s):

R. Singh ◽

K. Rajkanan ◽

J. Shewchun

Keyword(s):

Thin Films ◽

Solar Cell ◽

Transition Region

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SMALL POLARON FORMATION AND MOTION OF HOLES IN a-SiO2

The Physics of SiO2 and its Interfaces ◽

10.1016/b978-0-08-023049-8.50006-3 ◽

1978 ◽

pp. 14-18 ◽

Cited By ~ 5

Author(s):

R.C. Hughes ◽

D. Emin

Keyword(s):

Small Polaron ◽

Polaron Formation

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CHEMICAL BOND AND RELATED PROPERTIES OP SiO2

The Physics of SiO2 and its Interfaces ◽

10.1016/b978-0-08-023049-8.50025-7 ◽

1978 ◽

pp. 111-115 ◽

Cited By ~ 3

Author(s):

K. Hübner

Keyword(s):

Chemical Bond

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THE OPTICAL ABSORPTION SPECTRUM OF SiO2

The Physics of SiO2 and its Interfaces ◽

10.1016/b978-0-08-023049-8.50019-1 ◽

1978 ◽

pp. 80-84 ◽

Cited By ~ 5

Author(s):

Sokrates T. Pantelides

Keyword(s):

Absorption Spectrum ◽

Optical Absorption ◽

Optical Absorption Spectrum

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MODIFICATION OF SiOx

The Physics of SiO2 and its Interfaces ◽

10.1016/b978-0-08-023049-8.50056-7 ◽

1978 ◽

pp. 304-308 ◽

Cited By ~ 1

Author(s):

Stanford R. Ovshinsky ◽

Krishna Sapru ◽

Krystyna Dec

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THE Si-SiO2 INTERFACE AND LOCALIZATION IN THE INVERSION LAYER

The Physics of SiO2 and its Interfaces ◽

10.1016/b978-0-08-023049-8.50075-0 ◽

1978 ◽

pp. 407-411

Author(s):

M. Pepper

Keyword(s):

Inversion Layer

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ELECTRONIC STRUCTURES OF CRYSTALLINE AND AMORPHOUS SiO2

The Physics of SiO2 and its Interfaces ◽

10.1016/b978-0-08-023049-8.50014-2 ◽

1978 ◽

pp. 55-59 ◽

Cited By ~ 7

Author(s):

D.J. Chadi ◽

R.B. Laughlin ◽

J.D. Joannopoulos

Keyword(s):

Electronic Structures ◽

Amorphous Sio2

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