Frontiers In Electronic Testing - CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
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Published By Springer Netherlands

9781402083624, 9781402083631

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Soft Errors in SRAMs: Sources, Mechanisms and Mitigation Techniques

Frontiers In Electronic Testing - CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies ◽

10.1007/978-1-4020-8363-1_6 ◽

2008 ◽

pp. 159-181

Keyword(s):

Soft Errors ◽

Mitigation Techniques

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SRAM Cell Stability: Definition, Modeling and Testing

Frontiers In Electronic Testing - CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies ◽

10.1007/978-1-4020-8363-1_3 ◽

2008 ◽

pp. 39-77

Keyword(s):

Sram Cell ◽

Cell Stability ◽

Stability Definition

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Traditional SRAM Fault Models and Test Practices

Frontiers In Electronic Testing - CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies ◽

10.1007/978-1-4020-8363-1_4 ◽

2008 ◽

pp. 79-101

Keyword(s):

Fault Models

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SRAM Circuit Design and Operation

Frontiers In Electronic Testing - CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies ◽

10.1007/978-1-4020-8363-1_2 ◽

2008 ◽

pp. 13-38

Keyword(s):

Circuit Design

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Techniques for Detection of SRAM Cells with Stability Faults

Frontiers In Electronic Testing - CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies ◽

10.1007/978-1-4020-8363-1_5 ◽

2008 ◽

pp. 103-157

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Introduction and Motivation

Frontiers In Electronic Testing - CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies ◽

10.1007/978-1-4020-8363-1_1 ◽

2008 ◽

pp. 1-12 ◽

Cited By ~ 4

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