1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179)
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TOTAL DOCUMENTS

106

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Published By IEEE

0780344200

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Smart repeater for radar testing

1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179) ◽

10.1109/autest.1998.713506 ◽

2002 ◽

Cited By ~ 3

Author(s):

R. Lefevre ◽

R. Durand ◽

R. Satterfield ◽

A. MacMullen ◽

J. Walker ◽

...

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Design of safety-critical ASICs

1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179) ◽

10.1109/autest.1998.713413 ◽

2002 ◽

Cited By ~ 1

Author(s):

A.P. Ambler ◽

R. Zimmer ◽

A. Hunter ◽

I.D. Dear

Keyword(s):

Safety Critical

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A new approach to Navy ship munitions BIT and reprogramming

1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179) ◽

10.1109/autest.1998.713425 ◽

2002 ◽

Cited By ~ 1

Author(s):

S.A. Preiss

Keyword(s):

New Approach

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Challenges of MEMS device characterization in engineering development and final manufacturing

1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179) ◽

10.1109/autest.1998.713439 ◽

2002 ◽

Cited By ~ 3

Author(s):

T. Maudie ◽

T. Miller ◽

R. Nielsen ◽

D. Wallace ◽

T. Ruehs ◽

...

Keyword(s):

Device Characterization ◽

Engineering Development ◽

Mems Device

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Application of real-time simulation for test

1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179) ◽

10.1109/autest.1998.713501 ◽

2002 ◽

Author(s):

E. Sacher

Keyword(s):

Real Time ◽

Real Time Simulation ◽

Time Simulation

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Techniques and applications for neural networks "an air force perspective"

1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179) ◽

10.1109/autest.1998.713500 ◽

2002 ◽

Author(s):

L.V. Kirkland

Keyword(s):

Neural Networks ◽

Air Force

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Standard automatic test system (SATS) hardware interface standards for SATS frameworks, VXI instrument front panels, power module interface, augmentation module interface, receiver fixture interface, pin map configuration

1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179) ◽

10.1109/autest.1998.713509 ◽

2002 ◽

Author(s):

M.J. Stora

Keyword(s):

Test System ◽

Power Module ◽

Automatic Test ◽

Automatic Test System ◽

Hardware Interface

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Backup generator control and monitoring system for KSL TV

1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179) ◽

10.1109/autest.1998.713518 ◽

2002 ◽

Author(s):

P.W. Boyden

Keyword(s):

Monitoring System ◽

Control And Monitoring System

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Delay fault analysis using discrete event system approach

1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179) ◽

10.1109/autest.1998.713415 ◽

2002 ◽

Author(s):

G. Westerman ◽

C. Stroud ◽

J.R. Heath ◽

R. Kumar

Keyword(s):

System Approach ◽

Discrete Event ◽

Discrete Event System ◽

Fault Analysis ◽

Delay Fault ◽

Event System

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Clutter emulator for radar testing

1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179) ◽

10.1109/autest.1998.713505 ◽

2002 ◽

Cited By ~ 1

Author(s):

R. Lefevre ◽

E. Wilen ◽

R. Satterfield ◽

V. Wright ◽

R. DiDomizio

Download Full-text

1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Smart repeater for radar testing

Design of safety-critical ASICs

A new approach to Navy ship munitions BIT and reprogramming

Challenges of MEMS device characterization in engineering development and final manufacturing

Application of real-time simulation for test

Techniques and applications for neural networks "an air force perspective"

Standard automatic test system (SATS) hardware interface standards for SATS frameworks, VXI instrument front panels, power module interface, augmentation module interface, receiver fixture interface, pin map configuration

Backup generator control and monitoring system for KSL TV

Delay fault analysis using discrete event system approach

Clutter emulator for radar testing

1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179)
Latest Publications