Fabrication and Characterization in the Micro-Nano Range - Advanced Structured Materials
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Published By Springer Berlin Heidelberg

9783642177811, 9783642177828

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Ion Beam Sputtering: A Route for Fabrication of Highly Ordered Nanopatterns

Fabrication and Characterization in the Micro-Nano Range - Advanced Structured Materials ◽

10.1007/978-3-642-17782-8_4 ◽

2011 ◽

pp. 69-94 ◽

Cited By ~ 3

Author(s):

Marina Cornejo ◽

Jens Völlner ◽

Bashkim Ziberi ◽

Frank Frost ◽

Bernd Rauschenbach

Keyword(s):

Ion Beam ◽

Ion Beam Sputtering ◽

Beam Sputtering

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X-ray Microtomography: Characterisation of Structures and Defect Analysis

Fabrication and Characterization in the Micro-Nano Range - Advanced Structured Materials ◽

10.1007/978-3-642-17782-8_6 ◽

2011 ◽

pp. 119-149

Author(s):

Bernhard Harrer ◽

Johann Kastner

Keyword(s):

Defect Analysis ◽

X Ray

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Patterning and Optical Properties of Materials at the Nanoscale

Fabrication and Characterization in the Micro-Nano Range - Advanced Structured Materials ◽

10.1007/978-3-642-17782-8_3 ◽

2011 ◽

pp. 47-68

Author(s):

Noemí Pérez ◽

Ainara Rodríguez ◽

Santiago M. Olaizola

Keyword(s):

Optical Properties ◽

Properties Of Materials ◽

Optical Properties Of Materials

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Exploring the Possibilities of Laser Interference Patterning for the Rapid Fabrication of Periodic Arrays on Macroscopic Areas

Fabrication and Characterization in the Micro-Nano Range - Advanced Structured Materials ◽

10.1007/978-3-642-17782-8_1 ◽

2011 ◽

pp. 1-27 ◽

Cited By ~ 3

Author(s):

Andrés Fabián Lasagni

Keyword(s):

Laser Interference ◽

Periodic Arrays ◽

Rapid Fabrication

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Atom Probe Tomography: 3D Imaging at the Atomic Level

Fabrication and Characterization in the Micro-Nano Range - Advanced Structured Materials ◽

10.1007/978-3-642-17782-8_9 ◽

2011 ◽

pp. 201-222 ◽

Cited By ~ 3

Author(s):

D. Blavette ◽

F. Vurpillot ◽

B. Deconihout ◽

A. Menand

Keyword(s):

Atom Probe Tomography ◽

3D Imaging ◽

Atom Probe ◽

Atomic Level

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Three-Dimensional Open Cell Structures: Evaluation and Fabrication by Additive Manufacturing

Fabrication and Characterization in the Micro-Nano Range - Advanced Structured Materials ◽

10.1007/978-3-642-17782-8_5 ◽

2011 ◽

pp. 95-117 ◽

Cited By ~ 3

Author(s):

Jürgen Stampfl ◽

Heinz E. Pettermann ◽

Mathias H. Luxner

Keyword(s):

Additive Manufacturing ◽

Three Dimensional ◽

Open Cell ◽

Cell Structures

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Nano Characterization of Structures by Focused Ion Beam (FIB) Tomography

Fabrication and Characterization in the Micro-Nano Range - Advanced Structured Materials ◽

10.1007/978-3-642-17782-8_8 ◽

2011 ◽

pp. 171-199 ◽

Cited By ~ 3

Author(s):

Flavio Andrés Soldera ◽

Fernando Adrián Lasagni ◽

Frank Mücklich

Keyword(s):

Focused Ion Beam ◽

Ion Beam

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Submicron Tomography Using High Energy Synchrotron Radiation

Fabrication and Characterization in the Micro-Nano Range - Advanced Structured Materials ◽

10.1007/978-3-642-17782-8_7 ◽

2011 ◽

pp. 151-170 ◽

Cited By ~ 3

Author(s):

András Borbély ◽

Peter Cloetens ◽

Eric Maire ◽

Guillermo Requena

Keyword(s):

Synchrotron Radiation ◽

High Energy

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Laser Micromachining

Fabrication and Characterization in the Micro-Nano Range - Advanced Structured Materials ◽

10.1007/978-3-642-17782-8_2 ◽

2011 ◽

pp. 29-46 ◽

Cited By ~ 13

Author(s):

Udo Klotzbach ◽

Andrés Fabián Lasagni ◽

Michael Panzner ◽

Volker Franke

Keyword(s):

Laser Micromachining

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Fabrication and Characterization in the Micro-Nano Range - Advanced Structured MaterialsLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer Berlin Heidelberg

Ion Beam Sputtering: A Route for Fabrication of Highly Ordered Nanopatterns

X-ray Microtomography: Characterisation of Structures and Defect Analysis

Patterning and Optical Properties of Materials at the Nanoscale

Exploring the Possibilities of Laser Interference Patterning for the Rapid Fabrication of Periodic Arrays on Macroscopic Areas

Atom Probe Tomography: 3D Imaging at the Atomic Level

Three-Dimensional Open Cell Structures: Evaluation and Fabrication by Additive Manufacturing

Nano Characterization of Structures by Focused Ion Beam (FIB) Tomography

Submicron Tomography Using High Energy Synchrotron Radiation

Laser Micromachining

Fabrication and Characterization in the Micro-Nano Range - Advanced Structured Materials
Latest Publications