IEEE Transactions on Component Parts
Latest Publications

TOTAL DOCUMENTS

94

(FIVE YEARS 0)

H-INDEX

7

(FIVE YEARS 0)

Published By Institute Of Electrical And Electronics Engineers

2168-1716, 0097-6601

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Dielectric Properties of Thin Insulating Films of Photoresist Material

IEEE Transactions on Component Parts ◽

10.1109/tcp.1965.1135091 ◽

1965 ◽

Vol 12 (1) ◽

pp. 8-11 ◽

Cited By ~ 4

Author(s):

J. Pierce ◽

J. Pritchard

Keyword(s):

Dielectric Properties ◽

Insulating Films

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A New Approach to the Attainment of the Highest Possible Reliability in Tantalum Capacitors

IEEE Transactions on Component Parts ◽

10.1109/tcp.1965.1135087 ◽

1965 ◽

Vol 12 (1) ◽

pp. 21-29 ◽

Cited By ~ 1

Author(s):

J. Burnham

Keyword(s):

New Approach

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Magnetomechanical Applications Utilizing Silicon Iron

IEEE Transactions on Component Parts ◽

10.1109/tcp.1965.1135085 ◽

1965 ◽

Vol 12 (1) ◽

pp. 11-16

Author(s):

O. Chirino ◽

C. Jordan

Keyword(s):

Silicon Iron

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Thin-Film Titanium Dioxide Capacitors for Microelectronic Applications

IEEE Transactions on Component Parts ◽

10.1109/tcp.1965.1135086 ◽

1965 ◽

Vol 12 (1) ◽

pp. 16-20 ◽

Cited By ~ 3

Author(s):

F. Keister

Keyword(s):

Thin Film ◽

Titanium Dioxide

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Application of the Eyring Model to Capacitor Aging Data

IEEE Transactions on Component Parts ◽

10.1109/tcp.1965.1135088 ◽

1965 ◽

Vol 12 (1) ◽

pp. 34-41 ◽

Cited By ~ 76

Author(s):

H. Endicott ◽

B. Hatch ◽

R. Sohmer

Keyword(s):

Eyring Model

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The Optimization of Square-Law Elements Based on Silicon Carbide Nonlinear Resistors

IEEE Transactions on Component Parts ◽

10.1109/tcp.1965.1135089 ◽

1965 ◽

Vol 12 (1) ◽

pp. 3-7 ◽

Cited By ~ 2

Author(s):

B. Madden ◽

P. Souter

Keyword(s):

Silicon Carbide

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Surface Design Factors in the Evaporative Cooling of Electronic Components

IEEE Transactions on Component Parts ◽

10.1109/tcp.1965.1135090 ◽

1965 ◽

Vol 12 (1) ◽

pp. 29-33 ◽

Cited By ~ 2

Author(s):

V. Asch

Keyword(s):

Evaporative Cooling ◽

Electronic Components ◽

Surface Design ◽

Design Factors

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Some Measurement Techniques for Characterizing Sealed Reed Contact Performance

IEEE Transactions on Component Parts ◽

10.1109/tcp.1964.1135027 ◽

1964 ◽

Vol 11 (4) ◽

pp. 8-12 ◽

Cited By ~ 2

Author(s):

H. Wagar

Keyword(s):

Measurement Techniques

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Multistate Semiconductors

IEEE Transactions on Component Parts ◽

10.1109/tcp.1964.1135025 ◽

1964 ◽

Vol 11 (4) ◽

pp. 13-15 ◽

Cited By ~ 1

Author(s):

A. Soble

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The Q Contour-A Graphical Method for Characterizing Inductors

IEEE Transactions on Component Parts ◽

10.1109/tcp.1964.1135023 ◽

1964 ◽

Vol 11 (4) ◽

pp. 16-24

Author(s):

B. Tilson

Keyword(s):

Graphical Method

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