Scanning Probe Microscopy
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Published By Springer New York

9780387286679
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

UHV-STM Nanofabrication on Silicon

2007 ◽  
pp. 880-905
Author(s):  
Peter M. Albrecht ◽  
Laura B. Ruppalt ◽  
Joseph W. Lyding

SPM Measurements of Electric Properties of Organic Molecules

2007 ◽  
pp. 776-787
Author(s):  
Takao Ishida ◽  
Wataru Mizutani ◽  
Yasuhisa Naitoh ◽  
Hiroshi Tokumoto
Keyword(s):  
Organic Molecules ◽  
Electric Properties

Scanning Capacitance Microscopy

2007 ◽  
pp. 634-662 ◽  
Author(s):  
C. Y. Nakakura ◽  
P. Tangyunyong ◽  
M. L. Anderson
Keyword(s):  
Scanning Capacitance Microscopy

Electrochemical SPM

2007 ◽  
pp. 280-314 ◽  
Author(s):  
T. J. Smith ◽  
K. J. Stevenson

Frequency-Dependent Transport Imaging by Scanning Probe Microscopy

2007 ◽  
pp. 132-172 ◽  
Author(s):  
Ryan O’Hayre ◽  
Minhwan Lee ◽  
Fritz B. Prinz ◽  
Sergei V. Kalinin
Keyword(s):  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Frequency Dependent ◽  
Probe Microscopy ◽  
Dependent Transport

Probing Semiconductor Technology and Devices with Scanning Spreading Resistance Microscopy

2007 ◽  
pp. 31-87 ◽  
Author(s):  
P. Eyben ◽  
W. Vandervorst ◽  
D. Alvarez ◽  
M. Xu ◽  
M. Fouchier
Keyword(s):  
Semiconductor Technology ◽  
Spreading Resistance

Scanning Voltage Microscopy

2007 ◽  
pp. 561-600
Author(s):  
Scott B. Kuntze ◽  
Dayan Ban ◽  
Edward H. Sargent ◽  
St. John Dixon-Warren ◽  
J. Kenton White ◽  
...  

Ferroelectric Lithography

2007 ◽  
pp. 906-928 ◽  
Author(s):  
Dongbo Li ◽  
Dawn A. Bonnell
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