The Kluwer International Series in Engineering and Computer Science - VLSI Design for Manufacturing: Yield Enhancement
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Published By Springer US

9781461288169, 9781461315216

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Computer-Aided Manufacturing

The Kluwer International Series in Engineering and Computer Science - VLSI Design for Manufacturing: Yield Enhancement ◽

10.1007/978-1-4613-1521-6_6 ◽

1990 ◽

pp. 229-267

Author(s):

Stephen W. Director ◽

Wojciech Maly ◽

Andrzej J. Strojwas

Keyword(s):

Computer Aided Manufacturing ◽

Computer Aided

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Parametric Yield Maximization

The Kluwer International Series in Engineering and Computer Science - VLSI Design for Manufacturing: Yield Enhancement ◽

10.1007/978-1-4613-1521-6_2 ◽

1990 ◽

pp. 43-91

Author(s):

Stephen W. Director ◽

Wojciech Maly ◽

Andrzej J. Strojwas

Keyword(s):

Parametric Yield ◽

Yield Maximization

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Yield Estimation and Prediction

The Kluwer International Series in Engineering and Computer Science - VLSI Design for Manufacturing: Yield Enhancement ◽

10.1007/978-1-4613-1521-6_1 ◽

1990 ◽

pp. 1-42

Author(s):

Stephen W. Director ◽

Wojciech Maly ◽

Andrzej J. Strojwas

Keyword(s):

Yield Estimation ◽

Estimation And Prediction

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Functional Yield

The Kluwer International Series in Engineering and Computer Science - VLSI Design for Manufacturing: Yield Enhancement ◽

10.1007/978-1-4613-1521-6_5 ◽

1990 ◽

pp. 175-228

Author(s):

Stephen W. Director ◽

Wojciech Maly ◽

Andrzej J. Strojwas

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Statistical Analysis

The Kluwer International Series in Engineering and Computer Science - VLSI Design for Manufacturing: Yield Enhancement ◽

10.1007/978-1-4613-1521-6_4 ◽

1990 ◽

pp. 129-173

Author(s):

Stephen W. Director ◽

Wojciech Maly ◽

Andrzej J. Strojwas

Keyword(s):

Statistical Analysis

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Statistical Process Simulation

The Kluwer International Series in Engineering and Computer Science - VLSI Design for Manufacturing: Yield Enhancement ◽

10.1007/978-1-4613-1521-6_3 ◽

1990 ◽

pp. 93-128

Author(s):

Stephen W. Director ◽

Wojciech Maly ◽

Andrzej J. Strojwas

Keyword(s):

Process Simulation ◽

Statistical Process

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The Kluwer International Series in Engineering and Computer Science - VLSI Design for Manufacturing: Yield EnhancementLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer US

Computer-Aided Manufacturing

Parametric Yield Maximization

Yield Estimation and Prediction

Functional Yield

Statistical Analysis

Statistical Process Simulation

The Kluwer International Series in Engineering and Computer Science - VLSI Design for Manufacturing: Yield Enhancement
Latest Publications