Defect Recognition and Image Processing in Semiconductors 1997
Latest Publications

TOTAL DOCUMENTS

103

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By Routledge

9781315140810

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Materials issues in III-V alloy semiconductors and their influence on the degradation of optical devices (invited)

Defect Recognition and Image Processing in Semiconductors 1997 ◽

10.1201/9781315140810-94 ◽

2017 ◽

pp. 457-466

Author(s):

O. Ueda

Keyword(s):

Optical Devices ◽

Alloy Semiconductors

Download Full-text

Theoretical and experimental investigation of domain structure in rare earth gallates

Defect Recognition and Image Processing in Semiconductors 1997 ◽

10.1201/9781315140810-90 ◽

2017 ◽

pp. 433-436

Author(s):

A.O. Matkovskii ◽

D.I. Savytskii ◽

L.O. Vasylechko ◽

M. Kuzma

Keyword(s):

Experimental Investigation ◽

Rare Earth ◽

Domain Structure

Download Full-text

Comparison of Scanning Capacitance Microscopy and nano-Spreading Resistance Profiling as semiconductor dopant profilers

Defect Recognition and Image Processing in Semiconductors 1997 ◽

10.1201/9781315140810-8 ◽

2017 ◽

pp. 47-50

Author(s):

R.W. Tillmann ◽

M. Thamm ◽

A. Erickson ◽

D. Adderton

Keyword(s):

Spreading Resistance ◽

Scanning Capacitance Microscopy

Download Full-text

Observation of mid-gap states in n-type GaN with optical-isothermal capacitance transient spectroscopy

Defect Recognition and Image Processing in Semiconductors 1997 ◽

10.1201/9781315140810-72 ◽

2017 ◽

pp. 355-358

Author(s):

P. Hacke ◽

H. Okushi ◽

Y. Tokumaru

Keyword(s):

Transient Spectroscopy ◽

Gap States ◽

Capacitance Transient ◽

Isothermal Capacitance Transient Spectroscopy

Download Full-text

The nucleation sites of micropipes in SiC

Defect Recognition and Image Processing in Semiconductors 1997 ◽

10.1201/9781315140810-67 ◽

2017 ◽

pp. 331-334

Author(s):

J. Heindl ◽

V.D. Heydemann ◽

G. Pensl ◽

H.P. Strunk

Keyword(s):

Nucleation Sites

Download Full-text

Nanometer scale studies of defects in semiconductor films by near-field optical beam induced current (NOBIC)

Defect Recognition and Image Processing in Semiconductors 1997 ◽

10.1201/9781315140810-6 ◽

2017 ◽

pp. 27-36

Author(s):

Julia W. P. Hsu ◽

M. H. Gray ◽

Q. Xu

Keyword(s):

Near Field ◽

Optical Beam ◽

Nanometer Scale ◽

Induced Current ◽

Semiconductor Films ◽

Optical Beam Induced Current

Download Full-text

Structural Investigations of Grown-in D-Defects in Silicon by 1:1 Correlation of Brewster angle LST and TEM

Defect Recognition and Image Processing in Semiconductors 1997 ◽

10.1201/9781315140810-58 ◽

2017 ◽

pp. 289-292

Author(s):

G. Morgenstern ◽

G. Kissinger ◽

H. Richter ◽

D. Gräf ◽

U. Lambert ◽

...

Keyword(s):

Brewster Angle ◽

Structural Investigations

Download Full-text

Characterization of As-Grown Defects in Silicon

Defect Recognition and Image Processing in Semiconductors 1997 ◽

10.1201/9781315140810-57 ◽

2017 ◽

pp. 285-288

Author(s):

G. Kissinger ◽

D. Gräf ◽

U. Lambert ◽

G. Morgenstern ◽

J. Vanhellemont ◽

...

Download Full-text

Applications of image analysis for the quantitative characterisation of microstuctural defects in materials

Defect Recognition and Image Processing in Semiconductors 1997 ◽

10.1201/9781315140810-49 ◽

2017 ◽

pp. 237-244

Author(s):

H. E. Exner ◽

M. Rettenmayr

Keyword(s):

Image Analysis ◽

Quantitative Characterisation

Download Full-text

Surface characterization of microstructures on glass by atomic force microscopy and analytical scanning electron microscopy

Defect Recognition and Image Processing in Semiconductors 1997 ◽

10.1201/9781315140810-45 ◽

2017 ◽

pp. 221-224

Author(s):

T. Boeck ◽

K. Schmidt ◽

A. Gerlitzke ◽

P.-M. Wilde

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Atomic Force Microscopy ◽

Surface Characterization ◽

Force Microscopy ◽

Atomic Force ◽

Analytical Scanning Electron Microscopy ◽

Scanning Electron

Download Full-text

Defect Recognition and Image Processing in Semiconductors 1997Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Routledge

Materials issues in III-V alloy semiconductors and their influence on the degradation of optical devices (invited)

Theoretical and experimental investigation of domain structure in rare earth gallates

Comparison of Scanning Capacitance Microscopy and nano-Spreading Resistance Profiling as semiconductor dopant profilers

Observation of mid-gap states in n-type GaN with optical-isothermal capacitance transient spectroscopy

The nucleation sites of micropipes in SiC

Nanometer scale studies of defects in semiconductor films by near-field optical beam induced current (NOBIC)

Structural Investigations of Grown-in D-Defects in Silicon by 1:1 Correlation of Brewster angle LST and TEM

Characterization of As-Grown Defects in Silicon

Applications of image analysis for the quantitative characterisation of microstuctural defects in materials

Surface characterization of microstructures on glass by atomic force microscopy and analytical scanning electron microscopy

Defect Recognition and Image Processing in Semiconductors 1997
Latest Publications