Scanning Probe Microscopy of Functional Materials
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Published By Springer New York

9781441965677, 9781441971678

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Dynamic Force Microscopy and Spectroscopy in Ambient Conditions: Theory and Applications

Scanning Probe Microscopy of Functional Materials ◽

10.1007/978-1-4419-7167-8_3 ◽

2010 ◽

pp. 71-94

Author(s):

Hendrik Hölscher ◽

Jan-Erik Schmutz ◽

Udo D. Schwarz

Keyword(s):

Dynamic Force ◽

Ambient Conditions ◽

Force Microscopy

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Scanning Ion Conductance Microscopy

Scanning Probe Microscopy of Functional Materials ◽

10.1007/978-1-4419-7167-8_15 ◽

2010 ◽

pp. 433-460

Author(s):

Johannes Rheinlaender ◽

Tilman E. Schäffer

Keyword(s):

Ion Conductance ◽

Scanning Ion Conductance Microscopy

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Combined Voltage-Clamp and Atomic Force Microscope for the Study of Membrane Electromechanics

Scanning Probe Microscopy of Functional Materials ◽

10.1007/978-1-4419-7167-8_16 ◽

2010 ◽

pp. 461-489

Author(s):

Arthur Beyder ◽

Frederick Sachs

Keyword(s):

Atomic Force Microscope ◽

Voltage Clamp ◽

Atomic Force

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Symmetries in Piezoresponse Force Microscopy

Scanning Probe Microscopy of Functional Materials ◽

10.1007/978-1-4419-7167-8_13 ◽

2010 ◽

pp. 385-402

Author(s):

Andreas Ruediger

Keyword(s):

Piezoresponse Force Microscopy ◽

Force Microscopy

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Dynamic SPM Methods for Local Analysis of Thermo-Mechanical Properties

Scanning Probe Microscopy of Functional Materials ◽

10.1007/978-1-4419-7167-8_8 ◽

2010 ◽

pp. 199-229

Author(s):

M. P. Nikiforov ◽

Roger Proksch

Keyword(s):

Mechanical Properties ◽

Local Analysis

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Measuring Mechanical Properties on the Nanoscale with Contact Resonance Force Microscopy Methods

Scanning Probe Microscopy of Functional Materials ◽

10.1007/978-1-4419-7167-8_4 ◽

2010 ◽

pp. 95-124 ◽

Cited By ~ 6

Author(s):

D. C. Hurley

Keyword(s):

Mechanical Properties ◽

Force Microscopy ◽

Contact Resonance

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High-Resolution Architecture and Structural Dynamics of Microbial and Cellular Systems: Insights from in Vitro Atomic Force Microscopy

Scanning Probe Microscopy of Functional Materials ◽

10.1007/978-1-4419-7167-8_2 ◽

2010 ◽

pp. 39-68 ◽

Cited By ~ 4

Author(s):

Alexander J. Malkin ◽

Marco Plomp

Keyword(s):

Atomic Force Microscopy ◽

High Resolution ◽

Structural Dynamics ◽

Cellular Systems ◽

Force Microscopy ◽

Atomic Force

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Dynamic Nanomechanical Characterization Using Multiple-Frequency Method

Scanning Probe Microscopy of Functional Materials ◽

10.1007/978-1-4419-7167-8_6 ◽

2010 ◽

pp. 153-178

Author(s):

Ozgur Sahin

Keyword(s):

Multiple Frequency ◽

Frequency Method

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Polar Structures in Relaxors by Piezoresponse Force Microscopy

Scanning Probe Microscopy of Functional Materials ◽

10.1007/978-1-4419-7167-8_12 ◽

2010 ◽

pp. 345-383 ◽

Cited By ~ 4

Author(s):

V. V. Shvartsman ◽

W. Kleemann ◽

D. A. Kiselev ◽

I. K. Bdikin ◽

A. L. Kholkin

Keyword(s):

Piezoresponse Force Microscopy ◽

Force Microscopy

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Toward Nanoscale Chemical Imaging: The Intersection of Scanning Probe Microscopy and Mass Spectrometry

Scanning Probe Microscopy of Functional Materials ◽

10.1007/978-1-4419-7167-8_7 ◽

2010 ◽

pp. 181-198

Author(s):

Olga S. Ovchinnikova

Keyword(s):

Mass Spectrometry ◽

Scanning Probe Microscopy ◽

Chemical Imaging ◽

Scanning Probe ◽

Probe Microscopy ◽

Nanoscale Chemical Imaging

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Scanning Probe Microscopy of Functional MaterialsLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer New York

Dynamic Force Microscopy and Spectroscopy in Ambient Conditions: Theory and Applications

Scanning Ion Conductance Microscopy

Combined Voltage-Clamp and Atomic Force Microscope for the Study of Membrane Electromechanics

Symmetries in Piezoresponse Force Microscopy

Dynamic SPM Methods for Local Analysis of Thermo-Mechanical Properties

Measuring Mechanical Properties on the Nanoscale with Contact Resonance Force Microscopy Methods

High-Resolution Architecture and Structural Dynamics of Microbial and Cellular Systems: Insights from in Vitro Atomic Force Microscopy

Dynamic Nanomechanical Characterization Using Multiple-Frequency Method

Polar Structures in Relaxors by Piezoresponse Force Microscopy

Toward Nanoscale Chemical Imaging: The Intersection of Scanning Probe Microscopy and Mass Spectrometry

Scanning Probe Microscopy of Functional Materials
Latest Publications