1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.98TH8385)

Total dose and single event effects testing of UTMC commercial RadHard/sup TM/ gate arrays

1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.98TH8385) ◽

10.1109/redw.1998.731481 ◽

2002 ◽

Cited By ~ 6

Author(s):

D.B. Kerwin ◽

J.M. Benedetto

Keyword(s):

Total Dose ◽

Single Event ◽

Single Event Effects ◽

Gate Arrays

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Cocktails and other librations-the 88-inch cyclotron radiation effects facility

1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.98TH8385) ◽

10.1109/redw.1998.731497 ◽

2002 ◽

Author(s):

M.A. McMahan

Keyword(s):

Radiation Effects ◽

Cyclotron Radiation

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Single event effects test results for the 80C186 and 80C286 microprocessors and the SMJ320C30 and SMJ320C40 digital signal processors

1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.98TH8385) ◽

10.1109/redw.1998.731471 ◽

2002 ◽

Cited By ~ 2

Author(s):

S.H. Crain ◽

W.R. Crain ◽

K.B. Crawford ◽

S.J. Hansel ◽

P. Yu ◽

...

Keyword(s):

Digital Signal ◽

Digital Signal Processors ◽

Test Results ◽

Single Event ◽

Single Event Effects ◽

Signal Processors

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Total dose evaluation of state-of-the-art commercial analog to digital converters for space-based imaging applications

1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.98TH8385) ◽

10.1109/redw.1998.731490 ◽

2002 ◽

Cited By ~ 4

Author(s):

J.D. Black ◽

P.H. Eaton ◽

J.R. Chavez ◽

A.L. Wilson ◽

W.G. Merkel ◽

...

Keyword(s):

Total Dose ◽

State Of The Art ◽

Analog To Digital Converters ◽

Analog To Digital ◽

Dose Evaluation

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Heavy-ion study of single event effects in 12- and 16-bit ADCs

1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.98TH8385) ◽

10.1109/redw.1998.731474 ◽

2002 ◽

Cited By ~ 4

Author(s):

S. Bee ◽

G.R. Hopkinson ◽

R. Harboe-Sorensen ◽

L. Adams ◽

A. Smith

Keyword(s):

Heavy Ion ◽

Single Event ◽

Single Event Effects

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Neutron single event upsets in SRAM-based FPGAs

1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.98TH8385) ◽

10.1109/redw.1998.731500 ◽

2002 ◽

Cited By ~ 23

Author(s):

M. Ohlsson ◽

P. Dyreklev ◽

K. Johansson ◽

P. Alfke

Keyword(s):

Single Event ◽

Single Event Upsets

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Total ionizing dose effects on flash memories

1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.98TH8385) ◽

10.1109/redw.1998.731486 ◽

2002 ◽

Cited By ~ 40

Author(s):

D.N. Nguyen ◽

C.I. Lee ◽

A.H. Johnston

Keyword(s):

Total Ionizing Dose ◽

Flash Memories ◽

Dose Effects ◽

Total Ionizing Dose Effects

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Radiation testing results of COTS based space microcircuits

1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.98TH8385) ◽

10.1109/redw.1998.731499 ◽

2002 ◽

Cited By ~ 3

Author(s):

P. Layton ◽

H. Anthony ◽

R. Boss ◽

P. Hsu

Keyword(s):

Radiation Testing

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High total dose response of the UTMC gate array fabricated at Lockheed Martin Federal Systems

1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.98TH8385) ◽

10.1109/redw.1998.731483 ◽

2002 ◽

Cited By ~ 1

Author(s):

J.M. Benedetto ◽

A. Bishop ◽

M. Martin ◽

N. Haddad

Keyword(s):

Total Dose ◽

Dose Response ◽

Gate Array ◽

High Total Dose

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Single event effects on commercial SRAMs and power MOSFETs: final results of the CRUX flight experiment on APEX

1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.98TH8385) ◽

10.1109/redw.1998.731465 ◽

2002 ◽

Cited By ~ 6

Author(s):

J.L. Barth ◽

J.W. Adolphsen ◽

G.B. Gee

Keyword(s):

Single Event ◽

Power Mosfets ◽

Single Event Effects ◽

Flight Experiment

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1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.98TH8385)
Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Total dose and single event effects testing of UTMC commercial RadHard/sup TM/ gate arrays

Cocktails and other librations-the 88-inch cyclotron radiation effects facility

Single event effects test results for the 80C186 and 80C286 microprocessors and the SMJ320C30 and SMJ320C40 digital signal processors

Total dose evaluation of state-of-the-art commercial analog to digital converters for space-based imaging applications

Heavy-ion study of single event effects in 12- and 16-bit ADCs

Neutron single event upsets in SRAM-based FPGAs

Total ionizing dose effects on flash memories

Radiation testing results of COTS based space microcircuits

High total dose response of the UTMC gate array fabricated at Lockheed Martin Federal Systems

Single event effects on commercial SRAMs and power MOSFETs: final results of the CRUX flight experiment on APEX

Export Citation Format

1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.98TH8385)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Total dose and single event effects testing of UTMC commercial RadHard/sup TM/ gate arrays

Cocktails and other librations-the 88-inch cyclotron radiation effects facility

Single event effects test results for the 80C186 and 80C286 microprocessors and the SMJ320C30 and SMJ320C40 digital signal processors

Total dose evaluation of state-of-the-art commercial analog to digital converters for space-based imaging applications

Heavy-ion study of single event effects in 12- and 16-bit ADCs

Neutron single event upsets in SRAM-based FPGAs

Total ionizing dose effects on flash memories

Radiation testing results of COTS based space microcircuits

High total dose response of the UTMC gate array fabricated at Lockheed Martin Federal Systems

Single event effects on commercial SRAMs and power MOSFETs: final results of the CRUX flight experiment on APEX

1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.98TH8385)
Latest Publications