Introduction to Advanced System-on-Chip Test Design and Optimization - Frontiers in Electronic Testing
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Design for Test

Introduction to Advanced System-on-Chip Test Design and Optimization - Frontiers in Electronic Testing ◽

10.1007/0-387-25624-5_3 ◽

2005 ◽

pp. 21-52

Keyword(s):

Design For Test

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Defect-Aware Test Scheduling

Introduction to Advanced System-on-Chip Test Design and Optimization - Frontiers in Electronic Testing ◽

10.1007/0-387-25624-5_14 ◽

2005 ◽

pp. 277-290

Keyword(s):

Test Scheduling

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Test Power Dissipation

Introduction to Advanced System-on-Chip Test Design and Optimization - Frontiers in Electronic Testing ◽

10.1007/0-387-25624-5_7 ◽

2005 ◽

pp. 89-98

Keyword(s):

Power Dissipation ◽

Test Power

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Introduction

Introduction to Advanced System-on-Chip Test Design and Optimization - Frontiers in Electronic Testing ◽

10.1007/0-387-25624-5_1 ◽

2005 ◽

pp. 1-4

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Boundary Scan

Introduction to Advanced System-on-Chip Test Design and Optimization - Frontiers in Electronic Testing ◽

10.1007/0-387-25624-5_4 ◽

2005 ◽

pp. 53-64

Keyword(s):

Boundary Scan

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Test Access Mechanism

Introduction to Advanced System-on-Chip Test Design and Optimization - Frontiers in Electronic Testing ◽

10.1007/0-387-25624-5_8 ◽

2005 ◽

pp. 99-114

Keyword(s):

Test Access Mechanism

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Core Selection in the SOC Test Design-Flow

Introduction to Advanced System-on-Chip Test Design and Optimization - Frontiers in Electronic Testing ◽

10.1007/0-387-25624-5_13 ◽

2005 ◽

pp. 253-276

Keyword(s):

Design Flow ◽

Test Design ◽

Soc Test ◽

Core Selection

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Design Flow

Introduction to Advanced System-on-Chip Test Design and Optimization - Frontiers in Electronic Testing ◽

10.1007/0-387-25624-5_2 ◽

2005 ◽

pp. 5-19

Keyword(s):

Design Flow

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Test Scheduling

Introduction to Advanced System-on-Chip Test Design and Optimization - Frontiers in Electronic Testing ◽

10.1007/0-387-25624-5_9 ◽

2005 ◽

pp. 115-160

Keyword(s):

Test Scheduling

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Efficient Test Solutions for Core-Based Designs

Introduction to Advanced System-on-Chip Test Design and Optimization - Frontiers in Electronic Testing ◽

10.1007/0-387-25624-5_12 ◽

2005 ◽

pp. 215-251

Keyword(s):

Efficient Test

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