Atomic Force Microscopy in Process Engineering
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Published By Elsevier

9781856175173
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Measurement of Particle and Surface Interactions Using Force Microscopy

2009 ◽  
pp. 31-80 ◽  
Author(s):  
Nidal Hilal ◽  
Daniel Johnson ◽  
W. Richard Bowen ◽  
Paul M. Williams
Keyword(s):  
Surface Interactions ◽  
Force Microscopy

AFM and Development of (Bio)Fouling-Resistant Membranes

2009 ◽  
pp. 139-171 ◽  
Author(s):  
Nidal Hilal ◽  
W. Richard Bowen ◽  
Daniel Johnson ◽  
Huabing Yin

Micro/Nanoengineering and AFM for Cellular Sensing

2009 ◽  
pp. 195-224
Author(s):  
Huabing Yin ◽  
Gordon McPhee ◽  
Phil S. Dobson

Future Prospects

2009 ◽  
pp. 275-279
Author(s):  
W. Richard Bowen ◽  
Nidal Hilal
Keyword(s):  
Future Prospects

List of Contributors

2009 ◽  
pp. xv-xvi
Author(s):  
W. Richard Bowen ◽  
Nidal Hilal ◽  
Clive J. Roberts ◽  
Huabing Yin ◽  
Vasileios Koutsos ◽  
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