2018 48th European Solid-State Device Research Conference (ESSDERC)
Latest Publications

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Published By IEEE

9781538654019

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Sharp switching, hysteresis-free characteristics of Z2-FET for fast logic applications

2018 48th European Solid-State Device Research Conference (ESSDERC) ◽

10.1109/essderc.2018.8486915 ◽

2018 ◽

Cited By ~ 3

Author(s):

K. H. Lee ◽

H. El Dirani ◽

P. Fonteneau ◽

M. Bawedin ◽

S. Sato ◽

...

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Random Dopant Fluctuation and Random Telegraph Noise in Nanowire and Macaroni MOSFETs

2018 48th European Solid-State Device Research Conference (ESSDERC) ◽

10.1109/essderc.2018.8486871 ◽

2018 ◽

Cited By ~ 3

Author(s):

Alessandro S. Spinelli ◽

Christian Monzio Compagnoni ◽

Andrea L. Lacaita

Keyword(s):

Random Telegraph Noise ◽

Random Dopant Fluctuation ◽

Telegraph Noise ◽

Random Dopant

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Analytic variability study of inference accuracy in RRAM arrays with a binary tree winner-take-all circuit for neuromorphic applications

2018 48th European Solid-State Device Research Conference (ESSDERC) ◽

10.1109/essderc.2018.8486860 ◽

2018 ◽

Cited By ~ 1

Author(s):

Jonas Doevenspeck ◽

Robin Degraeve ◽

Stefan Cosemans ◽

Philippe Roussel ◽

Bram-Ernst Verhoef ◽

...

Keyword(s):

Binary Tree ◽

Winner Take All ◽

Variability Study ◽

Take All

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ESSDERC 2018 Author Index

2018 48th European Solid-State Device Research Conference (ESSDERC) ◽

10.1109/essderc.2018.8486904 ◽

2018 ◽

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ESSDERC 2018 Table of Contents

2018 48th European Solid-State Device Research Conference (ESSDERC) ◽

10.1109/essderc.2018.8486891 ◽

2018 ◽

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Novel IC Sub-Threshold IDDQ Signature And Its Relationship To Aging During High Voltage Stress

2018 48th European Solid-State Device Research Conference (ESSDERC) ◽

10.1109/essderc.2018.8486866 ◽

2018 ◽

Cited By ~ 1

Author(s):

Franco Stellari ◽

Naigang Wang ◽

Peilin Song

Keyword(s):

High Voltage ◽

Voltage Stress

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Double gate n-type WSe2 FETs with high-k top gate dielectric and enhanced electrostatic control

2018 48th European Solid-State Device Research Conference (ESSDERC) ◽

10.1109/essderc.2018.8486867 ◽

2018 ◽

Cited By ~ 4

Author(s):

Nicolo Oliva ◽

Emanuele A. Casu ◽

Matteo Cavalieri ◽

Adrian M. Ionescu

Keyword(s):

Gate Dielectric ◽

Double Gate ◽

High K ◽

Electrostatic Control

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Smart Connected Sensors - Enablers for the IoT

2018 48th European Solid-State Device Research Conference (ESSDERC) ◽

10.1109/essderc.2018.8486853 ◽

2018 ◽

Author(s):

Udo Gomez

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“In-memory Computing”: Accelerating AI Applications

2018 48th European Solid-State Device Research Conference (ESSDERC) ◽

10.1109/essderc.2018.8486900 ◽

2018 ◽

Author(s):

Evangelos Eleftheriou

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Towards IC-based quantum sensing - recent achievements and future research trends

2018 48th European Solid-State Device Research Conference (ESSDERC) ◽

10.1109/essderc.2018.8486873 ◽

2018 ◽

Cited By ~ 1

Author(s):

J. Anders ◽

T. Pfau ◽

J. Wrachtrup ◽

M.B. Plenio ◽

F. Jelezko ◽

...

Keyword(s):

Research Trends ◽

Future Research ◽

Quantum Sensing

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2018 48th European Solid-State Device Research Conference (ESSDERC)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Sharp switching, hysteresis-free characteristics of Z2-FET for fast logic applications

Random Dopant Fluctuation and Random Telegraph Noise in Nanowire and Macaroni MOSFETs

Analytic variability study of inference accuracy in RRAM arrays with a binary tree winner-take-all circuit for neuromorphic applications

ESSDERC 2018 Author Index

ESSDERC 2018 Table of Contents

Novel IC Sub-Threshold IDDQ Signature And Its Relationship To Aging During High Voltage Stress

Double gate n-type WSe2 FETs with high-k top gate dielectric and enhanced electrostatic control

Smart Connected Sensors - Enablers for the IoT

“In-memory Computing”: Accelerating AI Applications

Towards IC-based quantum sensing - recent achievements and future research trends

2018 48th European Solid-State Device Research Conference (ESSDERC)
Latest Publications