2014 IEEE International Reliability Physics Symposium
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9781479933174
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Mechanism exploration on Cu interconnect negative resistance shift during stress migration

2014 ◽  
Author(s):  
XiangFu Zhao ◽  
Dulin Wang ◽  
Howard Gan ◽  
Kevin Zheng ◽  
Jeff Wu ◽  
...  
Keyword(s):  
Negative Resistance ◽  
Cu Interconnect

Energy control paradigm for compliance-free reliable operation of RRAM

2014 ◽  
Author(s):  
P. R. Shrestha ◽  
D. Nminibapiel ◽  
J-H. Kim ◽  
J. P. Campbell ◽  
K. P. Cheung ◽  
...  
Keyword(s):  
Reliable Operation ◽  
Energy Control ◽  
Control Paradigm

Origin of the endurance degradation in the novel HfO2-based 1T ferroelectric non-volatile memories

2014 ◽  
Author(s):  
Ekaterina Yurchuk ◽  
Stefan Mueller ◽  
Dominik Martin ◽  
Stefan Slesazeck ◽  
Uwe Schroeder ◽  
...  
Keyword(s):  
The Novel
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