Springer Series in Surface Sciences - Auger- and X-Ray Photoelectron Spectroscopy in Materials Science
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Published By Springer Berlin Heidelberg

9783642273803, 9783642273810

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Quantitative Analysis (Data Evaluation)

Springer Series in Surface Sciences - Auger- and X-Ray Photoelectron Spectroscopy in Materials Science ◽

10.1007/978-3-642-27381-0_4 ◽

2012 ◽

pp. 77-204 ◽

Cited By ~ 1

Author(s):

Siegfried Hofmann

Keyword(s):

Quantitative Analysis ◽

Analysis Data ◽

Data Evaluation

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Practice of Surface and Interface Analysis with AES and XPS

Springer Series in Surface Sciences - Auger- and X-Ray Photoelectron Spectroscopy in Materials Science ◽

10.1007/978-3-642-27381-0_8 ◽

2012 ◽

pp. 409-449 ◽

Cited By ~ 1

Author(s):

Siegfried Hofmann

Keyword(s):

Interface Analysis ◽

Surface And Interface

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Optimizing Certainty and the Detection Limit: Signal-to-Noise Ratio

Springer Series in Surface Sciences - Auger- and X-Ray Photoelectron Spectroscopy in Materials Science ◽

10.1007/978-3-642-27381-0_6 ◽

2012 ◽

pp. 259-296

Author(s):

Siegfried Hofmann

Keyword(s):

Detection Limit ◽

Signal To Noise Ratio ◽

Signal To Noise ◽

Noise Ratio

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Instrumentation

Springer Series in Surface Sciences - Auger- and X-Ray Photoelectron Spectroscopy in Materials Science ◽

10.1007/978-3-642-27381-0_2 ◽

2012 ◽

pp. 11-41

Author(s):

Siegfried Hofmann

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Surface Analysis Techniques Related to AES and XPS

Springer Series in Surface Sciences - Auger- and X-Ray Photoelectron Spectroscopy in Materials Science ◽

10.1007/978-3-642-27381-0_10 ◽

2012 ◽

pp. 487-504

Author(s):

Siegfried Hofmann

Keyword(s):

Surface Analysis ◽

Analysis Techniques ◽

Surface Analysis Techniques

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Qualitative Analysis (Principle and Spectral Interpretation)

Springer Series in Surface Sciences - Auger- and X-Ray Photoelectron Spectroscopy in Materials Science ◽

10.1007/978-3-642-27381-0_3 ◽

2012 ◽

pp. 43-76 ◽

Cited By ~ 1

Author(s):

Siegfried Hofmann

Keyword(s):

Qualitative Analysis ◽

Spectral Interpretation

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Typical Applications of AES and XPS

Springer Series in Surface Sciences - Auger- and X-Ray Photoelectron Spectroscopy in Materials Science ◽

10.1007/978-3-642-27381-0_9 ◽

2012 ◽

pp. 451-485

Author(s):

Siegfried Hofmann

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Optimizing Measured Signal Intensity: Emission Angle, Incidence Angle and Surface Roughness

Springer Series in Surface Sciences - Auger- and X-Ray Photoelectron Spectroscopy in Materials Science ◽

10.1007/978-3-642-27381-0_5 ◽

2012 ◽

pp. 205-257 ◽

Cited By ~ 1

Author(s):

Siegfried Hofmann

Keyword(s):

Surface Roughness ◽

Signal Intensity ◽

Incidence Angle ◽

Emission Angle ◽

Measured Signal

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Introduction and Outline

Springer Series in Surface Sciences - Auger- and X-Ray Photoelectron Spectroscopy in Materials Science ◽

10.1007/978-3-642-27381-0_1 ◽

2012 ◽

pp. 1-10 ◽

Cited By ~ 1

Author(s):

Siegfried Hofmann

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Quantitative Compositional Depth Profiling

Springer Series in Surface Sciences - Auger- and X-Ray Photoelectron Spectroscopy in Materials Science ◽

10.1007/978-3-642-27381-0_7 ◽

2012 ◽

pp. 297-408 ◽

Cited By ~ 8

Author(s):

Siegfried Hofmann

Keyword(s):

Depth Profiling ◽

Compositional Depth Profiling

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Springer Series in Surface Sciences - Auger- and X-Ray Photoelectron Spectroscopy in Materials ScienceLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer Berlin Heidelberg

Quantitative Analysis (Data Evaluation)

Practice of Surface and Interface Analysis with AES and XPS

Optimizing Certainty and the Detection Limit: Signal-to-Noise Ratio

Instrumentation

Surface Analysis Techniques Related to AES and XPS

Qualitative Analysis (Principle and Spectral Interpretation)

Typical Applications of AES and XPS

Optimizing Measured Signal Intensity: Emission Angle, Incidence Angle and Surface Roughness

Introduction and Outline

Quantitative Compositional Depth Profiling

Springer Series in Surface Sciences - Auger- and X-Ray Photoelectron Spectroscopy in Materials Science
Latest Publications