Ion Beam Surface Layer Analysis
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TOTAL DOCUMENTS

41

(FIVE YEARS 0)

H-INDEX

7

(FIVE YEARS 0)

Published By Springer US

9781461588818, 9781461588795

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Characterization of Reordered (001) Au Surfaces by the Combined Techniques of Positive Ion Channeling Spectroscopy (PICS), LEED-AES, and Computer Simulation

Ion Beam Surface Layer Analysis ◽

10.1007/978-1-4615-8879-5_9 ◽

1976 ◽

pp. 607-625 ◽

Cited By ~ 12

Author(s):

B. R. Appleton ◽

D. M. Zehner ◽

T. S. Noggle ◽

J. W. Miller ◽

O. E. Schow ◽

...

Keyword(s):

Computer Simulation ◽

Ion Channeling ◽

Positive Ion

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Energy Dependence of Channeling Analysis in Implantation Damaged Al

Ion Beam Surface Layer Analysis ◽

10.1007/978-1-4615-8879-5_8 ◽

1976 ◽

pp. 597-605 ◽

Cited By ~ 9

Author(s):

E. Rimini ◽

S. U. Campisano ◽

G. Foti ◽

P. Baeri ◽

S. T. Picraux

Keyword(s):

Energy Dependence

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Studies on Compound Thin Film Semiconductors by Ion Beam and Electron Microscopy Techniques

Ion Beam Surface Layer Analysis ◽

10.1007/978-1-4615-8879-5_7 ◽

1976 ◽

pp. 585-595 ◽

Cited By ~ 2

Author(s):

S. U. Campisano ◽

G. Foti ◽

E. Rimini ◽

G. Vitali ◽

C. Corsi

Keyword(s):

Thin Film ◽

Electron Microscopy ◽

Ion Beam ◽

Thin Film Semiconductors ◽

Microscopy Techniques

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Sensitivity of Fluorine Detection in Different Matrices and at Different Depths Through the 19F(p,αγ)16O Reaction

Ion Beam Surface Layer Analysis ◽

10.1007/978-1-4615-8879-5_33 ◽

1976 ◽

pp. 873-883 ◽

Cited By ~ 3

Author(s):

M. A. Chaudhri ◽

G. Burns ◽

J. L. Rouse ◽

B. M. Spicer

Keyword(s):

Different Depths

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Z2 Dependence of the Electronic Stopping Power of 800 keV 14N+ Ions in Targets from Carbon through Molybdenum

Ion Beam Surface Layer Analysis ◽

10.1007/978-1-4615-8879-5_32 ◽

1976 ◽

pp. 863-871 ◽

Cited By ~ 1

Author(s):

D. G. Simons ◽

D. J. Land ◽

J. G. Brennan ◽

M. D. Brown

Keyword(s):

Stopping Power ◽

Electronic Stopping Power

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Application of Proton-Induced X-Ray Emission to Elemental Analysis of Oligo-Elements in Human Lymphocytes

Ion Beam Surface Layer Analysis ◽

10.1007/978-1-4615-8879-5_24 ◽

1976 ◽

pp. 785-793 ◽

Cited By ~ 2

Author(s):

M. C. Bonnet ◽

J. P. Thomas ◽

H. Betuel ◽

M. Fallavier ◽

S. Marsaud

Keyword(s):

Elemental Analysis ◽

Human Lymphocytes ◽

X Ray

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Depth Profiling with Ion Induced X-Rays

Ion Beam Surface Layer Analysis ◽

10.1007/978-1-4615-8879-5_20 ◽

1976 ◽

pp. 735-745 ◽

Cited By ~ 4

Author(s):

L. C. Feldman ◽

P. J. Silverman

Keyword(s):

Depth Profiling ◽

X Rays

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K-Shell Ionization of Boron Induced by Light Ions Bombardment

Ion Beam Surface Layer Analysis ◽

10.1007/978-1-4615-8879-5_18 ◽

1976 ◽

pp. 719-725 ◽

Cited By ~ 1

Author(s):

K. Kawatsura ◽

K. Ozawa ◽

F. Fujimoto ◽

M. Terasawa

Keyword(s):

Light Ions ◽

Shell Ionization

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Progress in the Description of Ion Induced X-Ray Production; Theory and Implication for Analysis

Ion Beam Surface Layer Analysis ◽

10.1007/978-1-4615-8879-5_17 ◽

1976 ◽

pp. 695-718 ◽

Cited By ~ 11

Author(s):

Finn Folkmann

Keyword(s):

Production Theory ◽

X Ray

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Surface Analysis of Ion Bombarded Metal Foils by XPS

Ion Beam Surface Layer Analysis ◽

10.1007/978-1-4615-8879-5_15 ◽

1976 ◽

pp. 675-684

Author(s):

E. Henrich ◽

H. J. Schmidt

Keyword(s):

Surface Analysis ◽

Metal Foils

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