2013 IEEE International Electron Devices Meeting
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9781479923069
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Connecting the physical and electrical properties of Hafnia-based RRAM

2013 ◽  
Author(s):  
B. Butcher ◽  
G. Bersuker ◽  
D. C. Gilmer ◽  
L. Larcher ◽  
A. Padovani ◽  
...  
Keyword(s):  
Electrical Properties

InGaAs MOSFETs for CMOS: Recent advances in process technology

2013 ◽  
Author(s):  
J. A. del Alamo ◽  
D. Antoniadis ◽  
A. Guo ◽  
D.-H. Kim ◽  
T.-W. Kim ◽  
...  
Keyword(s):  
Process Technology ◽  
Recent Advances

Carbon nanotube complementary logic based on Erbium contacts and self-assembled high purity solution tubes

2013 ◽  
Author(s):  
Shu-Jen Han ◽  
Satoshi Oida ◽  
Hongsik Park ◽  
James B. Hannon ◽  
George S. Tulevski ◽  
...  
Keyword(s):  
Carbon Nanotube ◽  
High Purity ◽  
Self Assembled

Retention time optimization for eDRAM in 22nm tri-gate CMOS technology

2013 ◽  
Author(s):  
Yih Wang ◽  
Umut Arslan ◽  
Nabhendra Bisnik ◽  
Ruth Brain ◽  
Swaroop Ghosh ◽  
...  
Keyword(s):  
Retention Time ◽  
Cmos Technology ◽  
Time Optimization
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