2013 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA)
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Published By IEEE

9781467330817, 9781467364225

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Analysis of Germanium FinFET logic circuits and SRAMs with asymmetric gate to source/drain underlap devices

2013 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) ◽

10.1109/vlsi-tsa.2013.6545633 ◽

2013 ◽

Author(s):

Vita Pi-Ho Hu ◽

Ming-Long Fan ◽

Pin Su ◽

Ching-Te Chuang

Keyword(s):

Logic Circuits

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Demonstration of chip level writability, endurance and data retention of an entire 8Mb STT-MRAM array

2013 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) ◽

10.1109/vlsi-tsa.2013.6545595 ◽

2013 ◽

Cited By ~ 4

Author(s):

Y. J. Lee ◽

G. Jan ◽

Y. J. Wang ◽

K. Pi ◽

T. Zhong ◽

...

Keyword(s):

Data Retention

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Study of ambient effect in active SiOx-based resistive switching memory

2013 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) ◽

10.1109/vlsi-tsa.2013.6545589 ◽

2013 ◽

Cited By ~ 4

Author(s):

Y. F. Chang ◽

P. Y. Chen ◽

B. Fowler ◽

Y. T. Chen ◽

F. Xue ◽

...

Keyword(s):

Resistive Switching ◽

Resistive Switching Memory ◽

Switching Memory

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Microscopic degradation models for advanced technology

2013 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) ◽

10.1109/vlsi-tsa.2013.6545623 ◽

2013 ◽

Author(s):

G. Bersuker

Keyword(s):

Advanced Technology ◽

Degradation Models

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Multilevel ultra-fast and disturb-free flash memory with double embedded Au and Gd2O3 nanocrystals

2013 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) ◽

10.1109/vlsi-tsa.2013.6545593 ◽

2013 ◽

Author(s):

Jer-Chyi Wang ◽

Chih-Ting Lin ◽

Po-Wei Huang ◽

Li-Chun Chang ◽

Chao-Sung Lai

Keyword(s):

Flash Memory

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SNR metric and crosstalk in color image sensor of small size pixel

2013 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) ◽

10.1109/vlsi-tsa.2013.6545641 ◽

2013 ◽

Cited By ~ 2

Author(s):

JungChak Ahn ◽

Bumsuk Kim ◽

Kyungho Lee ◽

Sangjun Choi ◽

Heegeun Jeong ◽

...

Keyword(s):

Color Image ◽

Image Sensor

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Laser anneal assisted contact resistivity reduction with post-silicide implantation for 14nm node and beyond

2013 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) ◽

10.1109/vlsi-tsa.2013.6545635 ◽

2013 ◽

Cited By ~ 1

Author(s):

C.-N Ni ◽

K. V. Rao ◽

F. Khaja ◽

S. Sharma ◽

B. Zheng ◽

...

Keyword(s):

Contact Resistivity ◽

Laser Anneal

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Challenges and opportunities in small pixel development for novel CMOS image sensors

2013 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) ◽

10.1109/vlsi-tsa.2013.6545642 ◽

2013 ◽

Cited By ~ 1

Author(s):

Shung Chieh ◽

G. Agranov ◽

Hui Tian ◽

C. Baron ◽

Hong-Wei Lee ◽

...

Keyword(s):

Image Sensors ◽

Cmos Image Sensors ◽

Challenges And Opportunities ◽

Small Pixel

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(110)-oriented germanium-tin (Ge0.97Sn0.03) P-channel MOSFETs

2013 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) ◽

10.1109/vlsi-tsa.2013.6545607 ◽

2013 ◽

Cited By ~ 2

Author(s):

Chunlei Zhan ◽

Wei Wang ◽

Xiao Gong ◽

Pengfei Guo ◽

Bin Liu ◽

...

Keyword(s):

Germanium Tin

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Microscopic model for the kinetics of the reset process in HfO2 RRAM

2013 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) ◽

10.1109/vlsi-tsa.2013.6545582 ◽

2013 ◽

Cited By ~ 4

Author(s):

A. Kalantarian ◽

G. Bersuker ◽

B. Butcher ◽

D. C. Gilmer ◽

S. Privitera ◽

...

Keyword(s):

Microscopic Model ◽

Kinetics Of

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2013 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Analysis of Germanium FinFET logic circuits and SRAMs with asymmetric gate to source/drain underlap devices

Demonstration of chip level writability, endurance and data retention of an entire 8Mb STT-MRAM array

Study of ambient effect in active SiOx-based resistive switching memory

Microscopic degradation models for advanced technology

Multilevel ultra-fast and disturb-free flash memory with double embedded Au and Gd2O3 nanocrystals

SNR metric and crosstalk in color image sensor of small size pixel

Laser anneal assisted contact resistivity reduction with post-silicide implantation for 14nm node and beyond

Challenges and opportunities in small pixel development for novel CMOS image sensors

(110)-oriented germanium-tin (Ge0.97Sn0.03) P-channel MOSFETs

Microscopic model for the kinetics of the reset process in HfO2 RRAM

2013 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA)
Latest Publications