Kelvin Probe Force Microscopy - Springer Series in Surface Sciences
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Published By Springer International Publishing

9783319756868, 9783319756875

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Kelvin Probe Force Microscopy with

Kelvin Probe Force Microscopy - Springer Series in Surface Sciences ◽

10.1007/978-3-319-75687-5_14 ◽

2018 ◽

pp. 437-463

Author(s):

Yan Jun Li ◽

Haunfei Wen ◽

Zong Min Ma ◽

Lili Kou ◽

Yoshitaka Naitoh ◽

...

Keyword(s):

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy

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Precise Modeling of Electrostatic Interactions with Dielectric Samples in Kelvin Probe Force Microscopy

Kelvin Probe Force Microscopy - Springer Series in Surface Sciences ◽

10.1007/978-3-319-75687-5_8 ◽

2018 ◽

pp. 201-226 ◽

Cited By ~ 1

Author(s):

Ali Sadeghi

Keyword(s):

Electrostatic Interactions ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy

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Time-Resolved Electrostatic and Kelvin Probe Force Microscopy

Kelvin Probe Force Microscopy - Springer Series in Surface Sciences ◽

10.1007/978-3-319-75687-5_5 ◽

2018 ◽

pp. 119-143 ◽

Cited By ~ 8

Author(s):

Sascha Sadewasser ◽

Nicoleta Nicoara

Keyword(s):

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Time Resolved ◽

Force Microscopy

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KPFM of Nanostructured Electrochemical Sensors

Kelvin Probe Force Microscopy - Springer Series in Surface Sciences ◽

10.1007/978-3-319-75687-5_12 ◽

2018 ◽

pp. 367-389 ◽

Cited By ~ 1

Author(s):

Alex Henning ◽

Yossi Rosenwaks

Keyword(s):

Electrochemical Sensors

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Quantitative Analysis of Kelvin Probe Force Microscopy on Semiconductors

Kelvin Probe Force Microscopy - Springer Series in Surface Sciences ◽

10.1007/978-3-319-75687-5_9 ◽

2018 ◽

pp. 227-247

Author(s):

Leo Polak ◽

Rinke J. Wijngaarden

Keyword(s):

Quantitative Analysis ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy

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Imaging Charge Distribution Within Molecules by Scanning Probe Microscopy

Kelvin Probe Force Microscopy - Springer Series in Surface Sciences ◽

10.1007/978-3-319-75687-5_16 ◽

2018 ◽

pp. 499-518

Author(s):

Martin Ondráček ◽

Prokop Hapala ◽

Martin Švec ◽

Pavel Jelínek

Keyword(s):

Charge Distribution ◽

Scanning Probe Microscopy ◽

Scanning Probe ◽

Probe Microscopy

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Practical Aspects of Kelvin Probe Force Microscopy in Liquids

Kelvin Probe Force Microscopy - Springer Series in Surface Sciences ◽

10.1007/978-3-319-75687-5_4 ◽

2018 ◽

pp. 101-118 ◽

Cited By ~ 1

Author(s):

Kei Kobayashi ◽

Hirofumi Yamada

Keyword(s):

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy

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Nanoscale Transport Imaging of Active Lateral Devices: Static and Frequency Dependent Modes

Kelvin Probe Force Microscopy - Springer Series in Surface Sciences ◽

10.1007/978-3-319-75687-5_10 ◽

2018 ◽

pp. 251-329 ◽

Cited By ~ 3

Author(s):

Evgheni Strelcov ◽

Mahshid Ahmadi ◽

Sergei V. Kalinin

Keyword(s):

Frequency Dependent ◽

Nanoscale Transport

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Dissipation Modulated Kelvin Probe Force Microscopy Method

Kelvin Probe Force Microscopy - Springer Series in Surface Sciences ◽

10.1007/978-3-319-75687-5_2 ◽

2018 ◽

pp. 23-47

Author(s):

Yoichi Miyahara ◽

Peter Grütter

Keyword(s):

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Microscopy Method

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Experimental Technique and Working Modes

Kelvin Probe Force Microscopy - Springer Series in Surface Sciences ◽

10.1007/978-3-319-75687-5_1 ◽

2018 ◽

pp. 3-22 ◽

Cited By ~ 1

Author(s):

Sascha Sadewasser ◽

Thilo Glatzel

Keyword(s):

Experimental Technique

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Kelvin Probe Force Microscopy - Springer Series in Surface SciencesLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer International Publishing

Kelvin Probe Force Microscopy with

Precise Modeling of Electrostatic Interactions with Dielectric Samples in Kelvin Probe Force Microscopy

Time-Resolved Electrostatic and Kelvin Probe Force Microscopy

KPFM of Nanostructured Electrochemical Sensors

Quantitative Analysis of Kelvin Probe Force Microscopy on Semiconductors

Imaging Charge Distribution Within Molecules by Scanning Probe Microscopy

Practical Aspects of Kelvin Probe Force Microscopy in Liquids

Nanoscale Transport Imaging of Active Lateral Devices: Static and Frequency Dependent Modes

Dissipation Modulated Kelvin Probe Force Microscopy Method

Experimental Technique and Working Modes

Kelvin Probe Force Microscopy - Springer Series in Surface Sciences
Latest Publications