Silicon-Based Millimeter-wave Technology - Measurement, Modeling and Applications - Advances in Imaging and Electron Physics
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9780123942982

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Editor-In-Chief

Silicon-Based Millimeter-wave Technology - Measurement, Modeling and Applications - Advances in Imaging and Electron Physics ◽

10.1016/b978-0-12-394298-2.21002-8 ◽

2012 ◽

pp. ii

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Nanoscale FETs

Silicon-Based Millimeter-wave Technology - Measurement, Modeling and Applications - Advances in Imaging and Electron Physics ◽

10.1016/b978-0-12-394298-2.00004-1 ◽

2012 ◽

pp. 261-347 ◽

Cited By ~ 1

Author(s):

Oana Moldovan ◽

Antonio Lázaro ◽

François Danneville ◽

Rodrigo Picos ◽

Bogdan Nae ◽

...

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Measurement Techniques and Issues

Silicon-Based Millimeter-wave Technology - Measurement, Modeling and Applications - Advances in Imaging and Electron Physics ◽

10.1016/b978-0-12-394298-2.00001-6 ◽

2012 ◽

pp. 1-117 ◽

Cited By ~ 1

Author(s):

M. Jamal Deen ◽

Ognian Marinov

Keyword(s):

Measurement Techniques

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Permission Acknowledgments

Silicon-Based Millimeter-wave Technology - Measurement, Modeling and Applications - Advances in Imaging and Electron Physics ◽

10.1016/b978-0-12-394298-2.22004-8 ◽

2012 ◽

pp. xx

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Copyright

Silicon-Based Millimeter-wave Technology - Measurement, Modeling and Applications - Advances in Imaging and Electron Physics ◽

10.1016/b978-0-12-394298-2.12001-0 ◽

2012 ◽

pp. iv

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Front Matter

Silicon-Based Millimeter-wave Technology - Measurement, Modeling and Applications - Advances in Imaging and Electron Physics ◽

10.1016/b978-0-12-394298-2.21001-6 ◽

2012 ◽

pp. iii

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Contents of Volumes 151-173

Silicon-Based Millimeter-wave Technology - Measurement, Modeling and Applications - Advances in Imaging and Electron Physics ◽

10.1016/b978-0-12-394298-2.00017-x ◽

2012 ◽

pp. 479-483

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RF MEMS Devices for Communication Systems

Silicon-Based Millimeter-wave Technology - Measurement, Modeling and Applications - Advances in Imaging and Electron Physics ◽

10.1016/b978-0-12-394298-2.00005-3 ◽

2012 ◽

pp. 349-390 ◽

Cited By ~ 1

Author(s):

M. Daneshmand ◽

R.R. Mansour

Keyword(s):

Communication Systems ◽

Rf Mems ◽

Mems Devices

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Modeling and Design of High-Frequency Structures Using Artificial Neural Networks and Space Mapping

Silicon-Based Millimeter-wave Technology - Measurement, Modeling and Applications - Advances in Imaging and Electron Physics ◽

10.1016/b978-0-12-394298-2.00003-x ◽

2012 ◽

pp. 223-260

Author(s):

Mohamed H. Bakr ◽

Mohamed H. Negm

Keyword(s):

Neural Networks ◽

Artificial Neural Networks ◽

High Frequency ◽

Space Mapping ◽

Artificial Neural

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Acknowledgements

Silicon-Based Millimeter-wave Technology - Measurement, Modeling and Applications - Advances in Imaging and Electron Physics ◽

10.1016/b978-0-12-394298-2.22003-6 ◽

2012 ◽

pp. xix

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Silicon-Based Millimeter-wave Technology - Measurement, Modeling and Applications - Advances in Imaging and Electron PhysicsLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Elsevier

Editor-In-Chief

Nanoscale FETs

Measurement Techniques and Issues

Permission Acknowledgments

Copyright

Front Matter

Contents of Volumes 151-173

RF MEMS Devices for Communication Systems

Modeling and Design of High-Frequency Structures Using Artificial Neural Networks and Space Mapping

Acknowledgements

Silicon-Based Millimeter-wave Technology - Measurement, Modeling and Applications - Advances in Imaging and Electron Physics
Latest Publications