Models in Hardware Testing - Frontiers in Electronic Testing
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Published By Springer Netherlands

9789048132812, 9789048132829
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Open Defects in Nanometer Technologies

2009 ◽  
pp. 1-31
Author(s):  
Joan Figueras ◽  
Rosa Rodríguez-Montañés ◽  
Daniel Arumí
Keyword(s):  
Open Defects

Models for Power-Aware Testing

2009 ◽  
pp. 187-215 ◽  
Author(s):  
Patrick Girard ◽  
Hans-Joachim Wunderlich

Models for Bridging Defects

2009 ◽  
pp. 33-70
Author(s):  
Michel Renovell ◽  
Florence Azais ◽  
Joan Figueras ◽  
Rosa Rodríguez-Montañés ◽  
Daniel Arumí

Models in Memory Testing

2009 ◽  
pp. 157-185 ◽  
Author(s):  
Stefano Di Carlo ◽  
Paolo Prinetto
Keyword(s):  
Memory Testing
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