1997 IEEE International Integrated Reliability Workshop Final Report (Cat No 97TH8319) IRWS-97
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Discussion Group Summary Wafer Level Reliability (wlr)

1997 IEEE International Integrated Reliability Workshop Final Report (Cat No 97TH8319) IRWS-97 ◽

10.1109/irws.1997.660299 ◽

2005 ◽

Author(s):

C. Messick ◽

S. Yankee

Keyword(s):

Discussion Group ◽

Wafer Level

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Discussion Group Summary Report Designing in Reliability - Dir

1997 IEEE International Integrated Reliability Workshop Final Report (Cat No 97TH8319) IRWS-97 ◽

10.1109/irws.1997.660298 ◽

2005 ◽

Author(s):

M. Poulter ◽

W. Vigrass

Keyword(s):

Discussion Group ◽

Summary Report

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Discussion Group Summary Customer Reliability Requirements

1997 IEEE International Integrated Reliability Workshop Final Report (Cat No 97TH8319) IRWS-97 ◽

10.1109/irws.1997.660300 ◽

2005 ◽

Author(s):

I. Wylie ◽

A. Preussger

Keyword(s):

Discussion Group

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Discussion Group Summary Reliability Test Structures

1997 IEEE International Integrated Reliability Workshop Final Report (Cat No 97TH8319) IRWS-97 ◽

10.1109/irws.1997.660301 ◽

2005 ◽

Author(s):

T. Turner

Keyword(s):

Discussion Group ◽

Reliability Test

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A practical statistical technique to improve seal integrity and reliability of microelectronic packages

1997 IEEE International Integrated Reliability Workshop Final Report (Cat No 97TH8319) IRWS-97 ◽

10.1109/irws.1997.660302 ◽

2002 ◽

Author(s):

T.R. Narasimhan ◽

E.H. Trotter

Keyword(s):

Statistical Technique ◽

Seal Integrity ◽

Microelectronic Packages

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Isothermal versus standard wafer electromigration test for the characterization of metal systems

1997 IEEE International Integrated Reliability Workshop Final Report (Cat No 97TH8319) IRWS-97 ◽

10.1109/irws.1997.660308 ◽

2002 ◽

Cited By ~ 2

Author(s):

D. Brisbin ◽

T. Turner

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Optimized application of antenna structures in a WLR monitoring program [IC testing]

1997 IEEE International Integrated Reliability Workshop Final Report (Cat No 97TH8319) IRWS-97 ◽

10.1109/irws.1997.660277 ◽

2002 ◽

Cited By ~ 1

Author(s):

J. Fazekas ◽

W. Asam ◽

J. Von Hagen

Keyword(s):

Monitoring Program ◽

Ic Testing

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Device design methodology and reliability strategy for deep sub-micron technology [DRAMs]

1997 IEEE International Integrated Reliability Workshop Final Report (Cat No 97TH8319) IRWS-97 ◽

10.1109/irws.1997.660315 ◽

2002 ◽

Author(s):

R. Divakaruni ◽

B. El-Kareh ◽

W.R. Tonti

Keyword(s):

Design Methodology ◽

Device Design

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CMOS transistor reliability and performance impacted by gate microstructure

1997 IEEE International Integrated Reliability Workshop Final Report (Cat No 97TH8319) IRWS-97 ◽

10.1109/irws.1997.660278 ◽

2002 ◽

Author(s):

B. Yu ◽

T.-J. King ◽

C. Hu ◽

D.-H. Ju ◽

N. Kepler

Keyword(s):

Cmos Transistor ◽

Transistor Reliability ◽

And Performance

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Charge-to-breakdown and trap generation process in thin oxides

1997 IEEE International Integrated Reliability Workshop Final Report (Cat No 97TH8319) IRWS-97 ◽

10.1109/irws.1997.660284 ◽

2002 ◽

Cited By ~ 1

Author(s):

G. Bersuker ◽

J. Werking ◽

D.Y. Chan

Keyword(s):

Generation Process

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1997 IEEE International Integrated Reliability Workshop Final Report (Cat No 97TH8319) IRWS-97Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Discussion Group Summary Wafer Level Reliability (wlr)

Discussion Group Summary Report Designing in Reliability - Dir

Discussion Group Summary Customer Reliability Requirements

Discussion Group Summary Reliability Test Structures

A practical statistical technique to improve seal integrity and reliability of microelectronic packages

Isothermal versus standard wafer electromigration test for the characterization of metal systems

Optimized application of antenna structures in a WLR monitoring program [IC testing]

Device design methodology and reliability strategy for deep sub-micron technology [DRAMs]

CMOS transistor reliability and performance impacted by gate microstructure

Charge-to-breakdown and trap generation process in thin oxides

1997 IEEE International Integrated Reliability Workshop Final Report (Cat No 97TH8319) IRWS-97
Latest Publications