2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS)
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9781538651087

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DCIS 2017 organization committee

2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS) ◽

10.1109/dcis.2017.8311623 ◽

2017 ◽

Keyword(s):

Organization Committee

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Detectability of structural defects using octree encoding

2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS) ◽

10.1109/dcis.2017.8311625 ◽

2017 ◽

Author(s):

Alvaro Gomez-Pau ◽

Luz Balado ◽

Joan Figueras

Keyword(s):

Structural Defects

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Message from the chairpersons

2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS) ◽

10.1109/dcis.2017.8311622 ◽

2017 ◽

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A comparison study of time-dependent dielectric breakdown for analog and digital circuit's optimal accelerated test regions

2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS) ◽

10.1109/dcis.2017.8311628 ◽

2017 ◽

Cited By ~ 1

Author(s):

Kexin Yang ◽

Taizhi Liu ◽

Rui Zhang ◽

Linda Milor

Keyword(s):

Dielectric Breakdown ◽

Time Dependent ◽

Comparison Study ◽

Accelerated Test ◽

Time Dependent Dielectric Breakdown

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Full-3D printed electronics process using stereolitography and electroless plating

2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS) ◽

10.1109/dcis.2017.8311624 ◽

2017 ◽

Cited By ~ 3

Author(s):

A. Salas-Barenys ◽

N. Vidal ◽

J. Sieiro ◽

J. M. Lopez-Villegas ◽

B. Medina-Rodriguez ◽

...

Keyword(s):

Electroless Plating ◽

Printed Electronics ◽

3D Printed ◽

3D Printed Electronics

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Random forest training stage acceleration using graphics processing units

2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS) ◽

10.1109/dcis.2017.8311636 ◽

2017 ◽

Author(s):

Abian Hernandez ◽

Himar Fabelo ◽

Samuel Ortega ◽

Abelardo Baez ◽

Gustavo M. Callico ◽

...

Keyword(s):

Random Forest ◽

Graphics Processing Units ◽

Training Stage ◽

Graphics Processing

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Variable-length transmission lines for self-healing systems and reconfigurable millimeter-wave integrated circuits

2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS) ◽

10.1109/dcis.2017.8311641 ◽

2017 ◽

Cited By ~ 2

Author(s):

David del Rio ◽

Inaki Gurutzeaga ◽

Hector Solar ◽

Andoni Beriain ◽

Ainhoa Rezola ◽

...

Keyword(s):

Integrated Circuits ◽

Millimeter Wave ◽

Transmission Lines ◽

Variable Length ◽

Self Healing ◽

Millimeter Wave Integrated Circuits

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Design and validation of a platform for electromagnetic fault injection

2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS) ◽

10.1109/dcis.2017.8311630 ◽

2017 ◽

Cited By ~ 2

Author(s):

Josep Balasch ◽

Daniel Arumi ◽

Salvador Manich

Keyword(s):

Fault Injection

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Break even time analysis using empirical overhead parameters for embedded systems on SOTB technology

2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS) ◽

10.1109/dcis.2017.8311633 ◽

2017 ◽

Cited By ~ 1

Author(s):

Carlos Cortes ◽

Hideharu Amano ◽

Nobuyuki Yamasaki

Keyword(s):

Embedded Systems ◽

Time Analysis

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Automated test program reordering for efficient SBST

2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS) ◽

10.1109/dcis.2017.8311634 ◽

2017 ◽

Author(s):

R. Cantoro ◽

E. Cetrulo ◽

E. Sanchez ◽

M. Sonza Reorda ◽

A. Voza

Keyword(s):

Test Program ◽

Automated Test

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2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

DCIS 2017 organization committee

Detectability of structural defects using octree encoding

Message from the chairpersons

A comparison study of time-dependent dielectric breakdown for analog and digital circuit's optimal accelerated test regions

Full-3D printed electronics process using stereolitography and electroless plating

Random forest training stage acceleration using graphics processing units

Variable-length transmission lines for self-healing systems and reconfigurable millimeter-wave integrated circuits

Design and validation of a platform for electromagnetic fault injection

Break even time analysis using empirical overhead parameters for embedded systems on SOTB technology

Automated test program reordering for efficient SBST

2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS)
Latest Publications