2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)
Latest Publications

TOTAL DOCUMENTS

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By IEEE

9781479913619

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

GaP source-drain SOI 1T-DRAM: Solving the key technological challenges

2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) ◽

10.1109/s3s.2013.6716573 ◽

2013 ◽

Author(s):

Ashish Pal ◽

Aneesh Nainani ◽

Zhiyuan Ye ◽

Xinyu Bao ◽

Errol Sanchez ◽

...

Download Full-text

Design of a robust and ultra-low-voltage pulse-triggered flip-flop in 28nm UTBB-FDSOI technology

2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) ◽

10.1109/s3s.2013.6716555 ◽

2013 ◽

Author(s):

Sebastien Bernard ◽

Alexandre Valentian ◽

Marc Belleville ◽

David Bol ◽

Jean-Didier Legat

Keyword(s):

Voltage Pulse ◽

Low Voltage ◽

Flip Flop

Download Full-text

Conference committee

2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) ◽

10.1109/s3s.2013.6716504 ◽

2013 ◽

Keyword(s):

Conference Committee

Download Full-text

Performance characteristics of 14 nm near threshold MCML circuits

2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) ◽

10.1109/s3s.2013.6716545 ◽

2013 ◽

Cited By ~ 1

Author(s):

Alexander Shapiro ◽

Eby G. Friedman

Keyword(s):

Performance Characteristics ◽

Near Threshold

Download Full-text

Envelope Tracking power amplifier optimization for mobile applications

2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) ◽

10.1109/s3s.2013.6716534 ◽

2013 ◽

Cited By ~ 2

Author(s):

James P. Young ◽

David Ripley ◽

Phil Lehtola

Keyword(s):

Power Amplifier ◽

Mobile Applications ◽

Envelope Tracking

Download Full-text

Fin width scaling for improved short channel control and performance in aggressively scaled channel length SOI finFETs

2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) ◽

10.1109/s3s.2013.6716521 ◽

2013 ◽

Cited By ~ 1

Author(s):

Abhijeet Paul ◽

Chun-chen Yeh ◽

Theodorus Standaert ◽

Jeffrey. B. Johnson ◽

Andres Bryant ◽

...

Keyword(s):

Channel Length ◽

Short Channel ◽

And Performance ◽

Channel Control

Download Full-text

Robust clock tree using single-well cells for multi-VT 28nm UTBB FD-SOI digital circuits

2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) ◽

10.1109/s3s.2013.6716540 ◽

2013 ◽

Author(s):

B. Giraud ◽

J. P. Noel ◽

F. Abouzeid ◽

S. Clerc ◽

Y. Thonnart

Keyword(s):

Digital Circuits ◽

Clock Tree ◽

Single Well

Download Full-text

A trench isolated thick SOI process as platform for various electrical and optical integrated devices

2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) ◽

10.1109/s3s.2013.6716538 ◽

2013 ◽

Author(s):

R. Lerner ◽

D. Gaebler ◽

K. Schottmann ◽

S. Hering

Keyword(s):

Integrated Devices

Download Full-text

SOI lateral bipolar transistor with drive current >3mA/μm

2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) ◽

10.1109/s3s.2013.6716518 ◽

2013 ◽

Cited By ~ 2

Author(s):

J. Cai ◽

T. H. Ning ◽

C. D'Emic ◽

J.-B. Yau ◽

K. K. Chan ◽

...

Keyword(s):

Bipolar Transistor ◽

Drive Current

Download Full-text

3D hetero-integration technology with backside TSV and reliability challenges

2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) ◽

10.1109/s3s.2013.6716516 ◽

2013 ◽

Author(s):

Kang-Wook Lee ◽

M. Murugesan ◽

T. Fukushima ◽

T. Tanaka ◽

M. Koyanagi

Keyword(s):

Integration Technology

Download Full-text

2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

GaP source-drain SOI 1T-DRAM: Solving the key technological challenges

Design of a robust and ultra-low-voltage pulse-triggered flip-flop in 28nm UTBB-FDSOI technology

Conference committee

Performance characteristics of 14 nm near threshold MCML circuits

Envelope Tracking power amplifier optimization for mobile applications

Fin width scaling for improved short channel control and performance in aggressively scaled channel length SOI finFETs

Robust clock tree using single-well cells for multi-VT 28nm UTBB FD-SOI digital circuits

A trench isolated thick SOI process as platform for various electrical and optical integrated devices

SOI lateral bipolar transistor with drive current >3mA/μm

3D hetero-integration technology with backside TSV and reliability challenges

2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)
Latest Publications