Experimental Methods - Treatise on Materials Science & Technology
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Published By Elsevier

9780123418197

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Preface

Experimental Methods - Treatise on Materials Science & Technology ◽

10.1016/b978-0-12-341819-7.50006-7 ◽

1980 ◽

pp. xi-xii

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The Measurement of Residual Stresses by X-Ray Diffraction Techniques

Experimental Methods - Treatise on Materials Science & Technology ◽

10.1016/b978-0-12-341819-7.50007-9 ◽

1980 ◽

pp. 1-62 ◽

Cited By ~ 33

Author(s):

M.R. James ◽

J.B. Cohen

Keyword(s):

Residual Stresses ◽

X Ray Diffraction ◽

X Ray

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Photoluminescence Techniques for Studies of Composition and Defects in Semiconductors

Experimental Methods - Treatise on Materials Science & Technology ◽

10.1016/b978-0-12-341819-7.50010-9 ◽

1980 ◽

pp. 151-212 ◽

Cited By ~ 4

Author(s):

B. Monemar

Keyword(s):

Defects In Semiconductors

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Foreword

Experimental Methods - Treatise on Materials Science & Technology ◽

10.1016/b978-0-12-341819-7.50005-5 ◽

1980 ◽

pp. ix

Author(s):

H. Herman

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Contents of Previous Volumes

Experimental Methods - Treatise on Materials Science & Technology ◽

10.1016/b978-0-12-341819-7.50013-4 ◽

1980 ◽

pp. 257-263

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Index

Experimental Methods - Treatise on Materials Science & Technology ◽

10.1016/b978-0-12-341819-7.50012-2 ◽

1980 ◽

pp. 253-256

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The Use of Mössbauer Spectroscopy in Materials Science

Experimental Methods - Treatise on Materials Science & Technology ◽

10.1016/b978-0-12-341819-7.50009-2 ◽

1980 ◽

pp. 107-150

Author(s):

Geoffrey Longworth

Keyword(s):

Mössbauer Spectroscopy ◽

Materials Science ◽

Mossbauer Spectroscopy ◽

Mößbauer Spectroscopy

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List of Contributors

Experimental Methods - Treatise on Materials Science & Technology ◽

10.1016/b978-0-12-341819-7.50004-3 ◽

1980 ◽

pp. vii

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Advisory Board

Experimental Methods - Treatise on Materials Science & Technology ◽

10.1016/b978-0-12-341819-7.50001-8 ◽

1980 ◽

pp. ii

Keyword(s):

Advisory Board

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Materials Production by High Rate Sputter Deposition

Experimental Methods - Treatise on Materials Science & Technology ◽

10.1016/b978-0-12-341819-7.50011-0 ◽

1980 ◽

pp. 213-251 ◽

Cited By ~ 2

Author(s):

S.D. Dahlgren

Keyword(s):

Sputter Deposition ◽

High Rate

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