2019 IEEE International Test Conference India (ITC India)
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9781728105734
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Demonstration of On-Chip Test Decompression for EDT using Binary Encoded Neural Autoencoders

2019 ◽  
Author(s):  
Philemon Daniel ◽  
Shaily Singh ◽  
Garima Gill ◽  
Anshu Gangwar ◽  
Bargaje Ganesh ◽  
...  
Keyword(s):  
On Chip

Applications of Test Techniques for Improving Silicon to Pre-Silicon Timing Correlation

2019 ◽  
Author(s):  
Reecha Jajodia ◽  
Sarvesh Sharma ◽  
Jaison Kurien ◽  
Kevin Zhou ◽  
Tezaswi Raja ◽  
...  

GPU-HBM SiP Interconnect Link Test and Repair

2019 ◽  
Author(s):  
Amanulla Khan ◽  
Himakiran Kodihalli ◽  
Thenappan Nachiappan ◽  
Sreekar Sreesailam ◽  
Seth Chou ◽  
...  

Improved Diagnosis Methodology for Multi-Defect Scenarios in High Compression Scan based Designs

2019 ◽  
Author(s):  
Bharath Nandakumar ◽  
Anil Malik ◽  
Atul Chhabra ◽  
Sameer Chillarige ◽  
Wilson Pradeep ◽  
...  
Keyword(s):  
High Compression

High Throughput Chain Diagnosis Methodology with Minimal Failure Data Collection

2019 ◽  
Author(s):  
Sameer Chillarige ◽  
Anil Malik ◽  
Atul Chhabra ◽  
Bharath Nandakumar ◽  
Kanika Kanwal
Keyword(s):  
Data Collection ◽  
High Throughput ◽  
Failure Data
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