2017 90th ARFTG Microwave Measurement Symposium (ARFTG)
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9781538643563

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Session pages

2017 90th ARFTG Microwave Measurement Symposium (ARFTG) ◽

10.1109/arftg.2017.8255865 ◽

2017 ◽

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Establishing traceability for on-wafer S-parameter measurements of membrane technology devices up to 110 GHz

2017 90th ARFTG Microwave Measurement Symposium (ARFTG) ◽

10.1109/arftg.2017.8255874 ◽

2017 ◽

Cited By ~ 8

Author(s):

Uwe Arz ◽

Sherko Zinal ◽

Thorsten Probst ◽

Gerd Hechtfischer ◽

Franz-Josef Schmuckle ◽

...

Keyword(s):

Membrane Technology ◽

S Parameter

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An intra-laboratory investigation of on-wafer measurement reproducibility at millimeter-wave frequencies

2017 90th ARFTG Microwave Measurement Symposium (ARFTG) ◽

10.1109/arftg.2017.8255866 ◽

2017 ◽

Cited By ~ 3

Author(s):

R G Clarke ◽

C Li ◽

N M Ridler

Keyword(s):

Laboratory Investigation ◽

Millimeter Wave ◽

Measurement Reproducibility

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Qualitative multidimensional calibration comparison

2017 90th ARFTG Microwave Measurement Symposium (ARFTG) ◽

10.1109/arftg.2017.8255870 ◽

2017 ◽

Author(s):

Aric W. Sanders ◽

Ronald A. Ginley ◽

Cristian J. Long ◽

Jasper A. Drisko ◽

Nathan D. Orloff ◽

...

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Development of a verification technique for on-wafer noise figure measurement systems

2017 90th ARFTG Microwave Measurement Symposium (ARFTG) ◽

10.1109/arftg.2017.8255878 ◽

2017 ◽

Cited By ~ 2

Author(s):

Aihua Wu ◽

Chong Li ◽

Jing Sun ◽

Yibang Wang ◽

Chen Liu

Keyword(s):

Noise Figure ◽

Measurement Systems

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Kicking the tires of the NIST microwave uncertainty framework, Part 2

2017 90th ARFTG Microwave Measurement Symposium (ARFTG) ◽

10.1109/arftg.2017.8255877 ◽

2017 ◽

Author(s):

Ronald A. Ginley

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Coplanar waveguide for dielectric material measurements at frequencies from 140 GHz to 220 GHz

2017 90th ARFTG Microwave Measurement Symposium (ARFTG) ◽

10.1109/arftg.2017.8255873 ◽

2017 ◽

Author(s):

X. Bao ◽

S. Liu ◽

I. Ocket ◽

J. Bao ◽

D. Kil ◽

...

Keyword(s):

Dielectric Material ◽

Coplanar Waveguide

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90th ARFTG conference organizers

2017 90th ARFTG Microwave Measurement Symposium (ARFTG) ◽

10.1109/arftg.2017.8255864 ◽

2017 ◽

Cited By ~ 1

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Establishing traceability for SOLT calibration kits

2017 90th ARFTG Microwave Measurement Symposium (ARFTG) ◽

10.1109/arftg.2017.8255871 ◽

2017 ◽

Cited By ~ 4

Author(s):

Ronald A. Ginley

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Background measurement of RF system nonlinearity using spread-spectrum methods

2017 90th ARFTG Microwave Measurement Symposium (ARFTG) ◽

10.1109/arftg.2017.8255881 ◽

2017 ◽

Cited By ~ 1

Author(s):

Adam R. Wichman ◽

Lawrence E. Larson

Keyword(s):

Spread Spectrum ◽

Rf System ◽

Background Measurement ◽

System Nonlinearity

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2017 90th ARFTG Microwave Measurement Symposium (ARFTG)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Session pages

Establishing traceability for on-wafer S-parameter measurements of membrane technology devices up to 110 GHz

An intra-laboratory investigation of on-wafer measurement reproducibility at millimeter-wave frequencies

Qualitative multidimensional calibration comparison

Development of a verification technique for on-wafer noise figure measurement systems

Kicking the tires of the NIST microwave uncertainty framework, Part 2

Coplanar waveguide for dielectric material measurements at frequencies from 140 GHz to 220 GHz

90th ARFTG conference organizers

Establishing traceability for SOLT calibration kits

Background measurement of RF system nonlinearity using spread-spectrum methods

2017 90th ARFTG Microwave Measurement Symposium (ARFTG)
Latest Publications