Science of Microscopy
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Published By Springer New York

9780387252964, 9780387497624
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Atomic Resolution Transmission Electron Microscopy

2008 ◽  
pp. 3-64 ◽  
Author(s):  
Angus I. Kirkland ◽  
Shery L. -Y. Chang ◽  
John L. Hutchison
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Atomic Resolution ◽  
Transmission Electron

Electron Holography

2008 ◽  
pp. 1141-1195 ◽  
Author(s):  
Rafal E. Dunin-Borkowski ◽  
Takeshi Kasama ◽  
Martha R. McCartney ◽  
David J. Smith
Keyword(s):  
Electron Holography

Aberration Correction

2008 ◽  
pp. 696-747 ◽  
Author(s):  
Peter W. Hawkes
Keyword(s):  
Aberration Correction

High-Speed Electron Microscopy

2008 ◽  
pp. 406-444 ◽  
Author(s):  
Wayne E. King ◽  
Michael R. Armstrong ◽  
Oleg Bostanjoglo ◽  
Bryan W. Reed
Keyword(s):  
Electron Microscopy ◽  
High Speed
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