Ionizing Radiation Effects in MOS Oxides - International Series on Advances in Solid State Electronics and Technology
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Published By WORLD SCIENTIFIC

9789810233266, 9789812813640

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Radiation-Induced Interface Traps

Ionizing Radiation Effects in MOS Oxides - International Series on Advances in Solid State Electronics and Technology ◽

10.1142/9789812813640_0003 ◽

2000 ◽

pp. 117-171

Keyword(s):

Interface Traps ◽

Radiation Induced

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BACK MATTER

Ionizing Radiation Effects in MOS Oxides - International Series on Advances in Solid State Electronics and Technology ◽

10.1142/9789812813640_bmatter ◽

2000 ◽

pp. 173-174

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Introduction

Ionizing Radiation Effects in MOS Oxides - International Series on Advances in Solid State Electronics and Technology ◽

10.1142/9789812813640_0001 ◽

2000 ◽

pp. 1-29

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Radiation-Induced Oxide-Trapped Charge

Ionizing Radiation Effects in MOS Oxides - International Series on Advances in Solid State Electronics and Technology ◽

10.1142/9789812813640_0002 ◽

2000 ◽

pp. 31-115

Keyword(s):

Radiation Induced ◽

Oxide Trapped Charge ◽

Trapped Charge

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FRONT MATTER

Ionizing Radiation Effects in MOS Oxides - International Series on Advances in Solid State Electronics and Technology ◽

10.1142/9789812813640_fmatter ◽

2000 ◽

pp. i-xiv

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