Characterization of Crystal Growth Defects by X-Ray Methods
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Published By Springer US

9781475711288, 9781475711264

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Experimental Techniques for the Study of Statistically Distributed Defects

Characterization of Crystal Growth Defects by X-Ray Methods ◽

10.1007/978-1-4757-1126-4_8 ◽

1980 ◽

pp. 186-215

Author(s):

Jochen R. Schneider

Keyword(s):

Experimental Techniques

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Defects and Their Detectability in Melt-Grown Crystals

Characterization of Crystal Growth Defects by X-Ray Methods ◽

10.1007/978-1-4757-1126-4_3 ◽

1980 ◽

pp. 46-72 ◽

Cited By ~ 6

Author(s):

D. T. J. Hurle ◽

B. Cockayne

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White Beam Synchrotron Radiation Topography

Characterization of Crystal Growth Defects by X-Ray Methods ◽

10.1007/978-1-4757-1126-4_16 ◽

1980 ◽

pp. 401-420 ◽

Cited By ~ 19

Author(s):

J. Miltat

Keyword(s):

Synchrotron Radiation ◽

White Beam

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Laboratory Techniques for Transmission X-Ray Topography

Characterization of Crystal Growth Defects by X-Ray Methods ◽

10.1007/978-1-4757-1126-4_15 ◽

1980 ◽

pp. 368-400 ◽

Cited By ~ 4

Author(s):

J. Chikawa

Keyword(s):

X Ray ◽

Laboratory Techniques

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Laboratory Techniques for X-ray Reflection Topography

Characterization of Crystal Growth Defects by X-Ray Methods ◽

10.1007/978-1-4757-1126-4_14 ◽

1980 ◽

pp. 349-367 ◽

Cited By ~ 9

Author(s):

R. W. Armstrong

Keyword(s):

X Ray ◽

Laboratory Techniques

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Perfect and Imperfect Crystals

Characterization of Crystal Growth Defects by X-Ray Methods ◽

10.1007/978-1-4757-1126-4_10 ◽

1980 ◽

pp. 264-297 ◽

Cited By ~ 2

Author(s):

N. Kato

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Industrial Implications of Crystal Quality

Characterization of Crystal Growth Defects by X-Ray Methods ◽

10.1007/978-1-4757-1126-4_1 ◽

1980 ◽

pp. 1-27

Author(s):

Eugene S. Meieran

Keyword(s):

Crystal Quality

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Elementary Dynamical Theory

Characterization of Crystal Growth Defects by X-Ray Methods ◽

10.1007/978-1-4757-1126-4_9 ◽

1980 ◽

pp. 216-263 ◽

Cited By ~ 5

Author(s):

Michael Hart

Keyword(s):

Dynamical Theory

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Defects and Their Detectability

Characterization of Crystal Growth Defects by X-Ray Methods ◽

10.1007/978-1-4757-1126-4_4 ◽

1980 ◽

pp. 73-96

Author(s):

J. R. Patel

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The Technical Importance of Growth Defects

Characterization of Crystal Growth Defects by X-Ray Methods ◽

10.1007/978-1-4757-1126-4_2 ◽

1980 ◽

pp. 28-45

Author(s):

A. D. Milne

Keyword(s):

Growth Defects

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Characterization of Crystal Growth Defects by X-Ray MethodsLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer US

Experimental Techniques for the Study of Statistically Distributed Defects

Defects and Their Detectability in Melt-Grown Crystals

White Beam Synchrotron Radiation Topography

Laboratory Techniques for Transmission X-Ray Topography

Laboratory Techniques for X-ray Reflection Topography

Perfect and Imperfect Crystals

Industrial Implications of Crystal Quality

Elementary Dynamical Theory

Defects and Their Detectability

The Technical Importance of Growth Defects

Characterization of Crystal Growth Defects by X-Ray Methods
Latest Publications