The International Series in Engineering and Computer Science - Dynamic Characterisation of Analogue-to-Digital Converters
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Published By Springer-Verlag

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Sinewave Test Setup

The International Series in Engineering and Computer Science - Dynamic Characterisation of Analogue-to-Digital Converters ◽

10.1007/0-387-25903-1_2 ◽

2006 ◽

pp. 47-60

Author(s):

Pierre-Yves Roy ◽

Jacques Durand

Keyword(s):

Test Setup

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Differential Gain and Phase Testing

The International Series in Engineering and Computer Science - Dynamic Characterisation of Analogue-to-Digital Converters ◽

10.1007/0-387-25903-1_8 ◽

2006 ◽

pp. 235-242

Author(s):

José Machado Silva ◽

Hélio Mendonça

Keyword(s):

Differential Gain

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ADC Applications, Architectures and Terminology

The International Series in Engineering and Computer Science - Dynamic Characterisation of Analogue-to-Digital Converters ◽

10.1007/0-387-25903-1_1 ◽

2006 ◽

pp. 3-45 ◽

Cited By ~ 2

Author(s):

José Machado Silva ◽

Hélio Mendonça

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Frequency-Domain Data Analysis

The International Series in Engineering and Computer Science - Dynamic Characterisation of Analogue-to-Digital Converters ◽

10.1007/0-387-25903-1_4 ◽

2006 ◽

pp. 85-103

Author(s):

Pierre-Yves Roy ◽

Jacques Durand

Keyword(s):

Data Analysis ◽

Frequency Domain

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Time-Domain Data Analysis

The International Series in Engineering and Computer Science - Dynamic Characterisation of Analogue-to-Digital Converters ◽

10.1007/0-387-25903-1_3 ◽

2006 ◽

pp. 61-84

Author(s):

Dominique Dallet ◽

Djamel Haddadi ◽

Philippe Marchegay

Keyword(s):

Data Analysis ◽

Time Domain ◽

Time Domain Data

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Comparative Study of ADC Sinewave Test Methods

The International Series in Engineering and Computer Science - Dynamic Characterisation of Analogue-to-Digital Converters ◽

10.1007/0-387-25903-1_6 ◽

2006 ◽

pp. 157-215

Author(s):

José Machado Silva ◽

Hélio Mendonça ◽

Sara Mazoleni

Keyword(s):

Comparative Study ◽

Test Methods

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Step and Transient Response Measurement

The International Series in Engineering and Computer Science - Dynamic Characterisation of Analogue-to-Digital Converters ◽

10.1007/0-387-25903-1_9 ◽

2006 ◽

pp. 243-254

Author(s):

Giovanni Chiorboli ◽

Carlo Morandi

Keyword(s):

Transient Response ◽

Response Measurement

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Code Histogram Test

The International Series in Engineering and Computer Science - Dynamic Characterisation of Analogue-to-Digital Converters ◽

10.1007/0-387-25903-1_5 ◽

2006 ◽

pp. 105-156

Author(s):

Giovanni Chiorboli ◽

Carlo Morandi

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Hysteresis Measurement

The International Series in Engineering and Computer Science - Dynamic Characterisation of Analogue-to-Digital Converters ◽

10.1007/0-387-25903-1_10 ◽

2006 ◽

pp. 255-264

Author(s):

Giovanni Chiorboli ◽

Carlo Morandi

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Jitter Measurement

The International Series in Engineering and Computer Science - Dynamic Characterisation of Analogue-to-Digital Converters ◽

10.1007/0-387-25903-1_7 ◽

2006 ◽

pp. 219-233

Author(s):

Pierre-Yves Roy ◽

Jacques Durand

Keyword(s):

Jitter Measurement

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The International Series in Engineering and Computer Science - Dynamic Characterisation of Analogue-to-Digital ConvertersLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer-Verlag

Sinewave Test Setup

Differential Gain and Phase Testing

ADC Applications, Architectures and Terminology

Frequency-Domain Data Analysis

Time-Domain Data Analysis

Comparative Study of ADC Sinewave Test Methods

Step and Transient Response Measurement

Code Histogram Test

Hysteresis Measurement

Jitter Measurement

The International Series in Engineering and Computer Science - Dynamic Characterisation of Analogue-to-Digital Converters
Latest Publications