Advances in X-Ray Analysis
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47

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6

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Published By Springer US

9781468476354, 9781468476330

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Lattice Strain Measurements on Deformed Fcc Metals

Advances in X-Ray Analysis ◽

10.1007/978-1-4684-7633-0_9 ◽

1966 ◽

pp. 103-114 ◽

Cited By ~ 2

Author(s):

Eckard Macherauch

Keyword(s):

Lattice Strain ◽

Strain Measurements ◽

Fcc Metals

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The Application of Cylindrical Geometry for the Determination of Crystal Orientation

Advances in X-Ray Analysis ◽

10.1007/978-1-4684-7633-0_5 ◽

1966 ◽

pp. 51-58

Author(s):

Robert D. Forest ◽

Richard J. Barton ◽

N. C. Schieltz

Keyword(s):

Crystal Orientation ◽

Cylindrical Geometry

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A “Windowless” X-Ray Fluorescence Tube and a High-Resolution Diffractometer

Advances in X-Ray Analysis ◽

10.1007/978-1-4684-7633-0_44 ◽

1966 ◽

pp. 504-507

Author(s):

George Walker

Keyword(s):

High Resolution ◽

X Ray

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A Blazed-Grating Scanning Spectrometer for Ultrasoft X-Rays Suitable for Use in an Electron Microprobe

Advances in X-Ray Analysis ◽

10.1007/978-1-4684-7633-0_38 ◽

1966 ◽

pp. 420-429 ◽

Cited By ~ 3

Author(s):

J. B. Nicholson ◽

M. F. Hasler

Keyword(s):

Electron Microprobe ◽

X Rays ◽

Blazed Grating

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X-Ray Techniques in the 1 to 400 Å Range

Advances in X-Ray Analysis ◽

10.1007/978-1-4684-7633-0_37 ◽

1966 ◽

pp. 410-419 ◽

Cited By ~ 1

Author(s):

Andrew A. Sterk

Keyword(s):

X Ray

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The Effect of Chemical Combination on X-Ray Spectra: Open Discussion

Advances in X-Ray Analysis ◽

10.1007/978-1-4684-7633-0_35 ◽

1966 ◽

pp. 393-397

Author(s):

Gavin R. Mallett ◽

Marie J. Fay ◽

William M. Mueller

Keyword(s):

X Ray ◽

Chemical Combination ◽

Open Discussion

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Chemical Effect on X-Ray Absorption-Edge Fine Structure

Advances in X-Ray Analysis ◽

10.1007/978-1-4684-7633-0_34 ◽

1966 ◽

pp. 376-392 ◽

Cited By ~ 7

Author(s):

E. W. White ◽

H. A. McKinstry

Keyword(s):

Fine Structure ◽

Absorption Edge ◽

Chemical Effect ◽

X Ray ◽

X Ray Absorption

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Lattice Defect Research by Kossel Technique and Deformation Analysis

Advances in X-Ray Analysis ◽

10.1007/978-1-4684-7633-0_3 ◽

1966 ◽

pp. 23-34 ◽

Cited By ~ 2

Author(s):

Masataka Umeno ◽

Hideaki Kawabe ◽

Gunji Shinoda

Keyword(s):

Lattice Defect ◽

Deformation Analysis ◽

Kossel Technique

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The Effect of Chemical Combination on the K X-ray Spectra of Silicon

Advances in X-Ray Analysis ◽

10.1007/978-1-4684-7633-0_29 ◽

1966 ◽

pp. 323-328 ◽

Cited By ~ 1

Author(s):

Donald M. Koffman ◽

Sheldon H. Moll

Keyword(s):

X Ray ◽

Chemical Combination

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A Method for Trace Analysis with an Electron Microprobe

Advances in X-Ray Analysis ◽

10.1007/978-1-4684-7633-0_24 ◽

1966 ◽

pp. 265-272

Author(s):

L. A. Fergason

Keyword(s):

Electron Microprobe ◽

Trace Analysis

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