Oxide Reliability - Selected Topics in Electronics and Systems
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Published By WORLD SCIENTIFIC

9789810248420, 9789812778062

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

MOSFET Gate Oxide Reliability: Anode Hole Injection Model and its Applications

Oxide Reliability - Selected Topics in Electronics and Systems ◽

10.1142/9789812778062_0005 ◽

2002 ◽

pp. 233-270 ◽

Cited By ~ 4

Author(s):

Yee-Chia Yeo ◽

Qiang Lu ◽

Chenming Hu

Keyword(s):

Gate Oxide ◽

Hole Injection ◽

Oxide Reliability ◽

Injection Model ◽

Anode Hole ◽

Anode Hole Injection

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PHYSICS AND CHEMISTRY OF INTRINSIC TIME-DEPENDENT DIELECTRIC BREAKDOWN IN SiO2 DIELECTRICS

Oxide Reliability - Selected Topics in Electronics and Systems ◽

10.1142/9789812778062_0003 ◽

2002 ◽

pp. 135-171 ◽

Cited By ~ 1

Author(s):

J. W. McPHERSON

Keyword(s):

Dielectric Breakdown ◽

Time Dependent ◽

Intrinsic Time ◽

Time Dependent Dielectric Breakdown

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BREAKDOWN MODES AND BREAKDOWN STATISTICS OF ULTRATHIN SiO2 GATE OXIDES

Oxide Reliability - Selected Topics in Electronics and Systems ◽

10.1142/9789812778062_0004 ◽

2002 ◽

pp. 173-232 ◽

Cited By ~ 4

Author(s):

JORDI SUÑE ◽

DAVID JIMENEZ ◽

ENRIQUE MIRANDA

Keyword(s):

Gate Oxides

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OXIDE WEAROUT, BREAKDOWN, AND RELIABILITY

Oxide Reliability - Selected Topics in Electronics and Systems ◽

10.1142/9789812778062_0001 ◽

2002 ◽

pp. 1-102 ◽

Cited By ~ 4

Author(s):

D. J. DUMIN

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Reliability of Flash Nonvolatile Memories

Oxide Reliability - Selected Topics in Electronics and Systems ◽

10.1142/9789812778062_0002 ◽

2002 ◽

pp. 103-134 ◽

Cited By ~ 5

Author(s):

Neal Mielke ◽

Jian Chen

Keyword(s):

Nonvolatile Memories

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FRONT MATTER

Oxide Reliability - Selected Topics in Electronics and Systems ◽

10.1142/9789812778062_fmatter ◽

2002 ◽

pp. i-ix

Author(s):

D. J. DUMIN

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Oxide Reliability - Selected Topics in Electronics and SystemsLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By WORLD SCIENTIFIC

MOSFET Gate Oxide Reliability: Anode Hole Injection Model and its Applications

PHYSICS AND CHEMISTRY OF INTRINSIC TIME-DEPENDENT DIELECTRIC BREAKDOWN IN SiO2 DIELECTRICS

BREAKDOWN MODES AND BREAKDOWN STATISTICS OF ULTRATHIN SiO2 GATE OXIDES

OXIDE WEAROUT, BREAKDOWN, AND RELIABILITY

Reliability of Flash Nonvolatile Memories

FRONT MATTER

Oxide Reliability - Selected Topics in Electronics and Systems
Latest Publications