Proceedings GaAs Reliability Workshop, 2003.
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12

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2

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High-resolution transmission electron microscopy on aged inp HBTs

Proceedings GaAs Reliability Workshop, 2003. ◽

10.1109/gaasrw.2003.183769 ◽

2003 ◽

Author(s):

T.J. Perham ◽

B.M. Paine ◽

S. Thomas

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Transmission Electron

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Lifetime acceleration model for HAST tests of a pHEMT process

Proceedings GaAs Reliability Workshop, 2003. ◽

10.1109/gaasrw.2003.183764 ◽

2003 ◽

Cited By ~ 8

Author(s):

P. Ersland ◽

Hei-Ruey Jen ◽

Xinxing Yang

Keyword(s):

Acceleration Model

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Hot electron effects on AlGaAs/InGaAs/GaAs PHEMT's under accelerated DC stresses and comparison with InGaP PHEMT's

Proceedings GaAs Reliability Workshop, 2003. ◽

10.1109/gaasrw.2003.183767 ◽

2003 ◽

Author(s):

H.K. Huang ◽

C.S. Wang ◽

Y.H. Wang

Keyword(s):

Hot Electron ◽

Electron Effects

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Role of carrier depletion effects and material properties in advanced microscale thermal modeling of GalnP/pGaAs heterojunction bipolar transistor (HBT) devices

Proceedings GaAs Reliability Workshop, 2003. ◽

10.1109/gaasrw.2003.183768 ◽

2003 ◽

Author(s):

S. Madra

Keyword(s):

Material Properties ◽

Thermal Modeling ◽

Bipolar Transistor ◽

Heterojunction Bipolar Transistor

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Investigation of reliability for C-doped InP/InGaAs/InP HBTs under high current density operation

Proceedings GaAs Reliability Workshop, 2003. ◽

10.1109/gaasrw.2003.183771 ◽

2003 ◽

Cited By ~ 2

Author(s):

K.T. Feng ◽

N.X. Nguyen ◽

Chanh Nguyen

Keyword(s):

Current Density ◽

High Current Density ◽

High Current

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Investigating thermal excursion failure mechanisms for flip chip

Proceedings GaAs Reliability Workshop, 2003. ◽

10.1109/gaasrw.2003.183770 ◽

2003 ◽

Cited By ~ 3

Author(s):

W.J. Roesch ◽

S. Jittinorasett

Keyword(s):

Flip Chip ◽

Failure Mechanisms ◽

Thermal Excursion

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Study on the origin of dc-to-RF dispersion effects in GaAs- and GaN-based beterostructure FETs

Proceedings GaAs Reliability Workshop, 2003. ◽

10.1109/gaasrw.2003.183773 ◽

2003 ◽

Cited By ~ 1

Author(s):

G. Verzellesi ◽

A. Mazzanti ◽

C. Canali ◽

G. Meneghesso ◽

A. Chini ◽

...

Keyword(s):

Dispersion Effects

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[Breaker pages]

Proceedings GaAs Reliability Workshop, 2003. ◽

10.1109/gaasrw.2003.183775 ◽

2003 ◽

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GaAs Reliability Workshop [front matter]

Proceedings GaAs Reliability Workshop, 2003. ◽

10.1109/gaasrw.2003.183774 ◽

2003 ◽

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Off-state PHEMT breakdown: a temperature-dependent analysis

Proceedings GaAs Reliability Workshop, 2003. ◽

10.1109/gaasrw.2003.183766 ◽

2003 ◽

Author(s):

P. Cova ◽

D. Gallinari ◽

N. Delmonte ◽

R. Alessi ◽

R. Menozzi

Keyword(s):

Temperature Dependent

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